Utility of Scanning Transmission X-ray Microscopy to Investigate Chemical Composition in Perovskite Thin Films

Haeyon Jun (1) , Denis Tondelier (2) , Bernard Geffroy (3, 2) , Jean-Eric Bourée (2) , Sufal Swaraj (1) , Yvan Bonnassieux (2)

1 SSOLEIL - Synchrotron SOLEIL
2 LPICM - Laboratoire de physique des interfaces et des couches minces [Palaiseau]
3 LICSEN - Laboratoire Innovation en Chimie des Surfaces et NanoSciences

Domains: Material chemistry

Haeyon Jun, Denis Tondelier, Bernard Geffroy, Jean-Eric Bourée, Sufal Swaraj, et al.. Utility of Scanning Transmission X-ray Microscopy to Investigate Chemical Composition in Perovskite Thin Films. Journées Nationales du Photovoltaïque, Jan 2021, Dourdan, France. , 2021. ⟨cea-03123519⟩