Journal Articles
IOP Conference Series: Materials Science and Engineering
Year : 2014
Emmanuel HADJI : Connect in order to contact the contributor
https://hal-cea.archives-ouvertes.fr/cea-01996778
Submitted on : Monday, January 28, 2019-3:40:54 PM
Last modification on : Friday, March 24, 2023-2:53:09 PM
Dates and versions
Identifiers
- HAL Id : cea-01996778 , version 1
- DOI : 10.1088/1757-899X/68/1/012005
Cite
Y Liu, D. Tainoff, M. Boukhari, Jacques Richard, A. Barski, et al.. Sensitive 3-omega measurements on epitaxial thermoelectric thin films. IOP Conference Series: Materials Science and Engineering, 2014, 68, pp.012005. ⟨10.1088/1757-899X/68/1/012005⟩. ⟨cea-01996778⟩
64
View
0
Download