Sensitive 3-omega measurements on epitaxial thermoelectric thin films

Y Liu (1) , D. Tainoff (1) , M. Boukhari (2) , Jacques Richard (1) , A. Barski (3) , P Bayle-Guillemaud , Emmanuel Hadji (4) , Olivier Bourgeois (1)

1 NEEL - TPS - Thermodynamique et biophysique des petits systèmes
2 CEA - Commissariat à l'énergie atomique et aux énergies alternatives
3 INAC - Institut Nanosciences et Cryogénie
4 SiNaps - Silicon Nanoelectronics Photonics and Structures

Domains: Physics [physics]; Condensed Matter [cond-mat]; Materials Science [cond-mat.mtrl-sci]; Physics [physics]; Physics [physics]; Optics [physics.optics]; Engineering Sciences [physics]; Electromagnetism; Engineering Sciences [physics]; Materials; Engineering Sciences [physics]; Optics / Photonic; Engineering Sciences [physics]; Micro and nanotechnologies/Microelectronics; Engineering Sciences [physics]; Electronics

Y Liu, D. Tainoff, M. Boukhari, Jacques Richard, A. Barski, et al.. Sensitive 3-omega measurements on epitaxial thermoelectric thin films. IOP Conference Series: Materials Science and Engineering, 2014, 68, pp.012005. ⟨10.1088/1757-899X/68/1/012005⟩. ⟨cea-01996778⟩