TID response of various field programmable gate arrays and memory devices

Jean-Marc Armani; J.L. Leray; R. Gaillard; V. Iluta

TID response of various field programmable gate arrays and memory devices

Jean-Marc Armani ¹ J.L. Leray ² R. Gaillard V. Iluta

1 DACLE-LIST - Département d'Architectures, Conception et Logiciels Embarqués-LIST

Abstract : The Total Ionizing Dose (TID) tolerance of some FPGAs and memory devices has been evaluated. Two FPGAs and five memories of various types and technologies have been irradiated. Results show that the total dose tolerance of the tested FPGAs is around 200 Gy. The SRAM is the most tolerant device with a failure dose level over 2.4 kGy. Two Flash memories were still well-functioning after 1 kGy.

Keywords : Field programmable gate arrays (FPGA) Total Ionizing Dose Total dose MRAM Flash Dose levels Static random access storage Signal receivers Reconfigurable hardware Radiation effects MRAM devices Logic gates Ionizing radiation Flash memory CMOS integrated circuits

Document type :

Conference papers

Domain :

Engineering Sciences [physics]

Complete list of metadatas

https://hal-cea.archives-ouvertes.fr/cea-01839850
Contributor : Léna Le Roy <>
Submitted on : Monday, July 16, 2018 - 10:05:40 AM
Last modification on : Monday, February 11, 2019 - 9:00:03 PM

TID response of various field programmable gate arrays and memory devices

Identifiers

Collections

Citation

Export

Metrics

50

Contact

TID response of various field programmable gate arrays and memory devices

Identifiers

Collections

Citation

Export

Share

Metrics

50

Contact