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Development of a System for Measuring the Shape of beta Spectra Using a Semiconductor Si Detector

Charlène Bisch 1, * Xavier Mougeot 1 Marie-Martine Bé 1 A.-M. Nourreddine 2
* Corresponding author
1 LNHB - Laboratoire National Henri Becquerel
DM2I - Département Métrologie Instrumentation & Information : DRT/LIST/DM2I
2 IPHC - Institut Pluridisciplinaire Hubert Curien
Abstract : A system for the measurement of beta energy spectra has been developed. It is based on a silicon semi-conductor detector operating at liquid nitrogen temperatures, under ultra high-vacuum. Monte-Carlo simulations were made to optimize the detection chamber and the source holder. Descriptions of the electronic and mechanical systems are included, as well as the first measured spectra
Keywords : metrology silicon semi-conductor detector beta spectrum Monte-Carlo simulations Si electron spectrometer instrumentation calibration ionizing radiations
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Journal articles
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https://hal-cea.archives-ouvertes.fr/cea-01827701
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Submitted on : Monday, July 2, 2018 - 3:49:35 PM
Last modification on : Friday, June 25, 2021 - 10:30:01 AM

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CEA | CNRS | DRS-IPHC | IPHC | DRT | LIST | SITE-ALSACE | DM2I | IN2P3 | GS-COMPUTER-SCIENCE

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Charlène Bisch, Xavier Mougeot, Marie-Martine Bé, A.-M. Nourreddine. Development of a System for Measuring the Shape of beta Spectra Using a Semiconductor Si Detector. Nuclear Data Sheets, Elsevier, 2014, 120, pp.95-98. ⟨10.1016/j.nds.2014.07.016⟩. ⟨cea-01827701⟩

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