Development of a System for Measuring the Shape of beta Spectra Using a Semiconductor Si Detector

Charlène Bisch; Xavier Mougeot; Marie-Martine Bé; A.-M. Nourreddine

doi:10.1016/j.nds.2014.07.016

Journal articles

Development of a System for Measuring the Shape of beta Spectra Using a Semiconductor Si Detector

Charlène Bisch ^{1, *} Xavier Mougeot ¹ Marie-Martine Bé ¹ A.-M. Nourreddine ²

* Corresponding author

1 LNHB - Laboratoire National Henri Becquerel

DM2I - Département Métrologie Instrumentation & Information : DRT/LIST/DM2I

2 IPHC - Institut Pluridisciplinaire Hubert Curien

Abstract : A system for the measurement of beta energy spectra has been developed. It is based on a silicon semi-conductor detector operating at liquid nitrogen temperatures, under ultra high-vacuum. Monte-Carlo simulations were made to optimize the detection chamber and the source holder. Descriptions of the electronic and mechanical systems are included, as well as the first measured spectra

Keywords : simulation silicon semi-conductor detector Monte-Carlo beta-rays beta spectrum detector metrology Si electron spectrometer instrumentation nuclear instrumentation calibration ionizing radiation radioactivity

Document type :

Journal articles

Domain :

Physics [physics] / Nuclear Experiment [nucl-ex]

Physics [physics] / Physics [physics] / Instrumentation and Detectors [physics.ins-det]

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https://hal-cea.archives-ouvertes.fr/cea-01827701
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Submitted on : Monday, May 30, 2022 - 11:22:47 AM
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Development of a System for Measuring the Shape of beta Spectra Using a Semiconductor Si Detector

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Development of a System for Measuring the Shape of beta Spectra Using a Semiconductor Si Detector

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