Development of a System for Measuring the Shape of beta Spectra Using a Semiconductor Si Detector

C. Bisch 1, * X. Mougeot 1 M.-M. Bé 1 A.-M. Nourreddine 2
* Corresponding author
1 LNHB - Laboratoire National Henri Becquerel
DM2I - Département Métrologie Instrumentation & Information : DRT/LIST/DM2I
2 IPHC - Institut Pluridisciplinaire Hubert Curien
Abstract : A system for the measurement of beta energy spectra has been developed. It is based on a silicon semi-conductor detector operating at liquid nitrogen temperatures, under ultra high-vacuum. Monte-Carlo simulations were made to optimize the detection chamber and the source holder. Descriptions of the electronic and mechanical systems are included, as well as the first measured spectra
Keywords : silicon semi-conductor detector beta spectrum Monte-Carlo simulations Si electron spectrometer instrumentation calibration
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Journal articles
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https://hal-cea.archives-ouvertes.fr/cea-01827701
Contributor : Bruno Savelli <>
Submitted on : Monday, July 2, 2018 - 3:49:35 PM
Last modification on : Monday, May 13, 2019 - 11:14:12 AM

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CEA | DRS-IPHC | IPHC | DRT | LIST | SITE-ALSACE | DM2I

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C. Bisch, X. Mougeot, M.-M. Bé, A.-M. Nourreddine. Development of a System for Measuring the Shape of beta Spectra Using a Semiconductor Si Detector. Nuclear Data Sheets, Elsevier, 2014, 120, pp.95-98. ⟨10.1016/j.nds.2014.07.016⟩. ⟨cea-01827701⟩

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