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Fluorescence dynamics and energy migration in Er3+-doped SRSO structure

Abstract : Decay time properties of erbium ions in silicon rich silicon oxide multilayers are reported. A non-exponential time behaviour for the 4I13/2 decay profile is observed and is interpreted in a diffusion-limited model. Furthermore, an appreciable increase of the lifetime of the 4I13/2 is observed when the sample temperature is lower than 50 K. The lifetime dependence of the 4I13/2 as a function of temperature was successfully fitted with a model taking into account the temperature dependence of the energy migration between Er3+ ions in the presence of quenching impurities.
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Submitted on : Monday, April 14, 2008 - 4:07:23 PM
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Antoine Al Choueiry, Anne-Marie Jurdyc, Bernard Jacquier, Fabrice Gourbilleau, Richard Rizk. Fluorescence dynamics and energy migration in Er3+-doped SRSO structure. Materials Science and Engineering: B, Elsevier, 2008, 146, pp.157-159. ⟨10.1016/j.mseb.2007.07.061⟩. ⟨cea-00273171⟩



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