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Journal Articles Materials Science and Engineering: B Year : 2008

Fluorescence dynamics and energy migration in Er3+-doped SRSO structure

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Abstract

Decay time properties of erbium ions in silicon rich silicon oxide multilayers are reported. A non-exponential time behaviour for the 4I13/2 decay profile is observed and is interpreted in a diffusion-limited model. Furthermore, an appreciable increase of the lifetime of the 4I13/2 is observed when the sample temperature is lower than 50 K. The lifetime dependence of the 4I13/2 as a function of temperature was successfully fitted with a model taking into account the temperature dependence of the energy migration between Er3+ ions in the presence of quenching impurities.

Dates and versions

cea-00273171 , version 1 (14-04-2008)

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Antoine Al Choueiry, Anne-Marie Jurdyc, Bernard Jacquier, Fabrice Gourbilleau, Richard Rizk. Fluorescence dynamics and energy migration in Er3+-doped SRSO structure. Materials Science and Engineering: B, 2008, 146, pp.157-159. ⟨10.1016/j.mseb.2007.07.061⟩. ⟨cea-00273171⟩
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