Fluorescence dynamics and energy migration in Er3+-doped SRSO structure - CEA - Commissariat à l’énergie atomique et aux énergies alternatives Accéder directement au contenu
Article Dans Une Revue Materials Science and Engineering: B Année : 2008

Fluorescence dynamics and energy migration in Er3+-doped SRSO structure

Résumé

Decay time properties of erbium ions in silicon rich silicon oxide multilayers are reported. A non-exponential time behaviour for the 4I13/2 decay profile is observed and is interpreted in a diffusion-limited model. Furthermore, an appreciable increase of the lifetime of the 4I13/2 is observed when the sample temperature is lower than 50 K. The lifetime dependence of the 4I13/2 as a function of temperature was successfully fitted with a model taking into account the temperature dependence of the energy migration between Er3+ ions in the presence of quenching impurities.

Dates et versions

cea-00273171 , version 1 (14-04-2008)

Identifiants

Citer

Antoine Al Choueiry, Anne-Marie Jurdyc, Bernard Jacquier, Fabrice Gourbilleau, Richard Rizk. Fluorescence dynamics and energy migration in Er3+-doped SRSO structure. Materials Science and Engineering: B, 2008, 146, pp.157-159. ⟨10.1016/j.mseb.2007.07.061⟩. ⟨cea-00273171⟩
47 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More