High Resolution Electron Microscopy of Grain Boundary Motion During Island Grain Shrinkage

U. Dahmen (1) , T. Radetic , M.L. Bowers , C. Ophus (2) , A. Gautam (2) , F. Lançon (3)

1 LBNL - Lawrence Berkeley National Laboratory [Berkeley]
2 NCEM - National Center for Electron Microscopy [LBNL Berkeley]
3 LSIM - Laboratory of Atomistic Simulation

Domaines: Science des matériaux [cond-mat.mtrl-sci]

U. Dahmen, T. Radetic, M.L. Bowers, C. Ophus, A. Gautam, et al.. High Resolution Electron Microscopy of Grain Boundary Motion During Island Grain Shrinkage. Microscopy and Microanalysis, 2016, 22 (S3), pp.1224-1225. ⟨10.1017/S1431927616006966⟩. ⟨hal-02143417⟩