Correlated Multiple Sampling impact analysis on 1/f^E noise for image sensors

A. Peizerat (1, 2) , G. Renaud (3, 1)

1 DOPT - Département d'Optronique
2 DACLE-LETI - Département d'Architectures, Conception et Logiciels Embarqués-LETI
3 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information

Correlated Multiple Sampling (CMS), which is an extension of Correlated Double Sampling (CDS), is a very popular noise reduction technique used in the readout chain of image sensors. It has been analyzed in the literature, showing that, with an increasingly number M of samples, the total noise tends to a limit value dominated by the pixel 1/f noise. Nevertheless, this approach fails to explain why, in some cases, the total noise measurement may reach a minimum before, against all odds, finally growing with M. This paper shows that an explanation can be found if the pixel noise Power Spectral Density (PSD) varies in 1/f$^E$ with a frequency exponent E > 1 instead of E=1.

Mots clés: Image sensor; 1/f noise; Correlated Double Sampling; Correlated Multiple Sampling; pixel

Domaines: Sciences de l'ingénieur [physics]

A. Peizerat, G. Renaud. Correlated Multiple Sampling impact analysis on 1/f^E noise for image sensors. Journal of Electronic Imaging, 2019, 31 (9), pp.368-1-368-6. ⟨10.2352/ISSN.2470-1173.2019.9.IMSE-368⟩. ⟨cea-04548728⟩