, brevet : FR3026227, 1 brevet déposé 2013 2 brevets : US2015355784, FR3001063 2012 1 brevet : US2015220211 2010 6 brevets : US2012162391, US2012162410, US2012147230, US2012092459, US2011073976, US2012161269 2009 1 brevet : US2010289101 2008 2 brevets : EP2180513 (US2010102206), US2009244347 2005 2 brevets : US2006152616, EP1626442 (US2006033008) 2003 1 brevet FR2862426 (US2006278906)

, Comités de lecture de journaux internationaux

, Applied Optics (1 articles), JOSA A (1 article), EuroPhysics Letters

, Applied Optics (2 articles), Optics Express (1 article)

, Applied Optics (3 articles)

, Applied Optics (1 article), Optics Letters (1 article), 2011.

, Applied Optics (1 article)

, Applied Optics (2 articles), Optics Express (1 article)

R. S. Aikens, Solid-State Imagers for Microscopy, Methods in Cell Biology, vol.29, pp.291-313, 1989.

E. R. Fossum and D. B. Hondongwa, « A Review of the Pinned Photodiode for CCD and CMOS Image Sensors, IEEE Journal of the Electron Devices Society, vol.2, issue.3, pp.2168-6734, 2014.

T. Steinich and V. Blahnik, « Optical Design of Camera Optics for Mobile Phones, Advanced Optical Technologies, vol.1, pp.2192-8584, 2012.

, « Optical Imaging Lens Assembly ». US2012194920. H.-H. Huang. 2 août, 2012.

Y. Ma and V. N. Borovytsky, « Design of a 16.5 Megapixel Camera Lens for a Mobile Phone, Open Access Library 02, pp.2333-9705, 2015.

C. Buil, Canon EOS 350d -Filter Removal Operation and Performances, 2010.

A. E. Gamal and H. Eltoukhy, CMOS Image Sensors, vol.21, pp.8755-3996, 2005.

O. Yadid-pecht, R. Etienne-cummings, and É. Imagers, , 2004.

M. Sarkar and A. Theuwissen, A Biologically Inspired CMOS Image Sensor. T. 461. Studies in Computational Intelligence, 2013.

J. C. Liu, Advanced 1.1um Pixel CMOS Image Sensor with 3D Stacked Architecture, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers. 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers. Juin, pp.1-2, 2014.
URL : https://hal.archives-ouvertes.fr/hal-01645247

N. Dutton, « Noise in Single-Photon-Counting Image Sensors, IEEE INTER-NATIONAL SOLID-STATE CIRCUITS CONFERENCE. ISSC, 2016.

A. Boukhayma, A Sub-0.5 Electron Read Noise VGA Image Sensor in a Standard CMOS Process, IEEE Journal of Solid-State Circuits, vol.51, issue.9, pp.2180-2191

. Kawabata, A 1.8e-Temporal Noise Over 90dB Dynamic Range 4k2k Super 35mm Format Seamless Global Shutter CMOS Image Sensor with Multiple-Accumulation Shutter Technology, 2016 IEEE International Electron Devices Meeting. IEDM, 2016.
URL : https://hal.archives-ouvertes.fr/in2p3-00192306

R. J. Baker, CMOS Circuit Design, Layout, and Simulation. 3rd

. Bibliographie,

C. Ketchazo, A New Technique of Characterization of Intrapixel Response Dedicated to Astronomical Detectors, Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. New Developments in Photodetection NDIP14 787 (1 er juil. 2015), pp.265-269

J. Vaillant, Versatile Method for Optical Performances Characterization of off-Axis CMOS Pixels with Microlens Radial Shift, Proceedings of SPIE. T. 6817, 2008.

H. Mutoh, « Simulation for 3-D optical and electrical analysis of CCD, IEEE Transactions on Electron Devices, vol.44, 1997.

H. Mutoh, « 3-D Optical and Electrical Simulation for CMOS Image Sensors, IEEE Transaction on Electron Devices, 2003.
DOI : 10.1109/ted.2002.806965

P. B. Catrysse, « QE Reduction due to Pixel Vignetting in CMOS Image Sensors, Proceedings of SPIE. Sous la dir. de M. M. Blouke et al. 15 mai, pp.420-430, 2000.
DOI : 10.1117/12.385460
URL : http://isl.stanford.edu/groups/elgamal/abbas_publications/C074.pdf

J. Vaillant and F. Hirigoyen, « Optical Simulation for CMOS Imager Microlens Optimization, Proceedings of SPIE. Photonics Europe. International Society for Optics and Photonics, pp.200-210, 2004.
DOI : 10.1117/12.546000

M. G. Moharam and T. K. Gaylord, « Rigorous coupled-wave analysis of planar-grating diffraction, J. Opt. Soc. Am, vol.71, pp.811-818, 1981.
DOI : 10.1364/josa.71.000811

A. Taflove and S. C. Hagness, Computational Electrodynamics: The Finite-Difference TimeDomain Method, Third Edition. 3 rd . Artech House, pp.978-979, 2004.

K. Yee, « Numerical solution of initial boundary value problems involving maxwell's equations in isotropic media, IEEE Transactions on Antennas and Propagation, vol.14, issue.3, pp.302-307, 1966.

J. Vaillant, Uniform Illumination and Rigorous Electromagnetic Simulations Applied to CMOS Image Sensors, Optics Express, vol.15, pp.1094-4087, 2007.
DOI : 10.1364/oe.15.005494

H. Sumi, « Low-noise imaging system with CMOS image sensor for high-quality imaging, IEEE Electron Devices Meeting (IEDM). Sous la dir. d'IEEE, 2008.
DOI : 10.1109/iedm.2006.346974

J. Gambino, « CMOS Imager with copper wiring and lightpipe, IEEE Electron Devices Meeting (IEDM). Sous la dir. d'IEEE, 2006.
DOI : 10.1109/iedm.2006.346977

. Chipworks, STMicroelectronics 5 Mp 1.4 M m Pixel Pitch CMOS Image Sensor -Imager Process Review, 2010.

A. Crocherie, From Photons to Electrons: A Complete 3D Simulation Flow for CMOS Image Sensor, International Image Sensor Workshop (IISW), 2009.

F. Hirigoyen, « Finite-Difference Time Domain Based Electro-Optical Methodologies to Improve CMOS Image Sensor Pixels Performances, Proceedings of SPIE. T. 7723, 2010.
DOI : 10.1117/12.854546

J. Alakarhu, « Image Sensors and Image Quality in Mobile Phones.pdf, 2007.

M. Parmar and S. J. Reeves, « Selection of Optimal Spectral Sensitivity Functions for Color Filter Arrays, 2006 International Conference on Image Processing. 2006 International Conference on Image Processing, pp.1005-1008, 2006.

J. Farrell, « Sensor Calibration and Simulation, pp.68170-68170, 2008.

J. E. Farrell and B. A. Wandell, « Image Systems Simulation, SID Symposium Digest of Technical Papers, vol.46, issue.1, pp.2168-0159

J. E. Farrell, « Digital Camera Simulation, Applied Optics, vol.51, issue.1, 2012.

C. Mornet, Evaluation of Color Error and Noise on Simulated Images, Proceedings of SPIE. Digital Photography VI. T. 7537. 2010, pp.75370-75370
URL : https://hal.archives-ouvertes.fr/hal-00603659

C. Mornet, Toward a Quantitative Visual Noise Evaluation of Sensors and Image Processing Pipes, Proceedings of SPIE. T. 7876, pp.78760-78760, 2011.

C. Mornet, An Image Quality Evaluation Tool Simulating Image Sensors Including Quantum Efficiency off-Axis Effect, Proceedings of SPIE. Digital Photography VII. Sous la dir, p.78760, 2011.

J. Vaillant, Characterization of Pixel Crosstalk and Impact of Bayer Patterning by Quantum Efficiency Measurement, Proceedings of SPIE. Digital Photography VII. T. 7876, pp.787613-787613, 2011.

M. Larabi, Quality Assessment of Still Images, Advanced Color Image Processing and Analysis. Sous la dir. de C. Fernandez-Maloigne, pp.423-447, 2013.
URL : https://hal.archives-ouvertes.fr/hal-00915239

M. Shohara and K. Kotani, « The Visual Perception Sensitivity for Achromatic Noise and Chromatic Noise, 2013 IEEE International Conference on Image Processing, pp.127-131, 2013.

K. Baeg, Organic Light Detectors: Photodiodes and Phototransistors, Advanced Materials, vol.25, pp.4267-4295

F. Arca, Near-Infrared Organic Photodiodes, IEEE Journal of Quantum Electronics 49.12 (déc. 2013), pp.1558-1713

L. Dou, Low-Bandgap Near-IR Conjugated Polymers/Molecules for Organic Electronics, Chemical Reviews, vol.115, issue.9, p.26287387, 2015.

B. Bouthinon, Impact of Blend Morphology on Interface State Recombination in Bulk Heterojunction Organic Solar Cells, Advanced Functional Materials, vol.25, pp.1616-3028, 2015.
URL : https://hal.archives-ouvertes.fr/hal-01100102

M. Delbracio and G. Sapiro, « Removing Camera Shake via Weighted Fourier Burst Accumulation, IEEE Transactions on Image Processing, vol.24, pp.1057-7149, 2015.

Y. Tendero and J. Morel, « A Theory of Optimal Flutter Shutter For Probabilistic Velocity Models, SIAM journal on Imaging Sciences (SIIMS), pp.1-31, 2015.

S. Su and W. Heidrich, « Rolling Shutter Motion Deblurring, 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR). 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR). Juin, pp.1529-1537, 2015.

G. Meynants, Global Shutter Imagers for Industrial Applications ». In : t. 9141, pp.914108-914108, 2014.

A. Theuwissen-;-de and G. Meijer, Smart Sensor Systems. Sous la dir, pp.978-979, 2014.

N. Pears, 3D Imaging, Analysis and Applications, 2012.

F. Remondino and D. Stoppa, TOF Range-Imaging Cameras | Fabio Remondino | Springer, 2013.

R. Lange and P. Seitz, « Solid-State Time-of-Flight Range Camera, IEEE Journal of Quantum Electronics, vol.37, pp.18-9197, 2001.

A. Payne, A 512x424 CMOS 3D Time-of-Flight Image Sensor with Multi-Frequency Photo-Demodulation up to 130MHz and 2GS/S ADC, pp.134-135, 2014.

S. J. Kim, A Three-Dimensional Time-of-Flight CMOS Image Sensor With PinnedPhotodiode Pixel Structure, IEEE Electron Device Letters, vol.31, pp.741-3106, 2010.

A. Spickermann, « CMOS 3D Image Sensor Based on Pulse Modulated Time-of-Flight Principle and Intrinsic Lateral Drift-Field Photodiode Pixels, ESSCIRC (ESSCIRC), 2011 Proceedings of the. ESSCIRC (ESSCIRC), 2011 Proceedings of the, pp.111-114, 2011.

E. Charbon, Single-Photon Imaging in Complementary Metal Oxide Semiconductor Processes, Philosophical transactions. Series A, Mathematical, physical, and engineering sciences 372, p.24567470, 2012.

A. Rochas, Single Photon Detector Fabricated in a Complemnetar Metal Oxode Semiconductor High-Voltage Technology, Review of Scientific Instruments, vol.74, pp.34-6748, 2003.

C. Niclass and E. Charbon, « A Single Photon Detector Array with 64x64 Resolution and Millimetric Depth Accuracy for 3D Imaging, Digest of Technical Papers -IEEE ISSCC, vol.48, pp.364-365, 2005.

E. Charbon, « Single Photon Imagers, Paper STu3G.5. CLEO: Science and Innovations, 2014.

M. Lee, A First Single-Photon Avalanche Diode Fabricated in Standard SOI CMOS Technology with a Full Characterization of the Device, Optics Express, vol.23, pp.1094-4087

G. Gariepy, Single-Photon Sensitive Light-in-Fight Imaging, Nature Communications, vol.6, pp.2041-1723, 2015.

R. H. Haitz, « Model for the Electrical Behavior of a Microplasma, Journal of Applied Physics, vol.35, pp.1370-1376, 1964.

C. Veerappan, A 160x128 Single-Photon Image Sensor with on-Pixel 55ps 10b Timeto-Digital Converter, 2011 IEEE International Solid-State Circuits Conference. 2011 IEEE International Solid-State Circuits Conference. Fév, pp.312-314, 2011.

J. M. Pavia, Measurement and Modeling of Microlenses Fabricated on Single-Photon Avalanche Diode Arrays for Fill Factor Recovery, Optics Express, vol.22, pp.1094-4087

G. Intermite, Enhancing the Fill-Factor of CMOS SPAD Arrays Using Microlens Integration, Proceedings of SPIE. Photon Counting Applications. T. 9504. SPIE, 2015.

M. Gersbach, High Frame-Rate TCSPC-FLIM Using a Novel SPAD-Based Image Sensor, pp.77801-77801

D. D. and .. Li, Video-Rate Fluorescence Lifetime Imaging Camera with CMOS SinglePhoton Avalanche Diode Arrays and High-Speed Imaging Algorithm, Journal of Biomedical Optics, vol.16, issue.9, p.21950926

D. Stoppa, Single-Photon Avalanche Diode CMOS Sensor for Time-Resolved Fluorescence Measurements, IEEE Sensors Journal, vol.9

K. Onozawa, IEEE Transactions on Electron Devices 55.4 (avr. 2008)

J. N. Mait, er sept, Binary Subwavelength Diffractive-Lens Design, vol.23, pp.1539-4794, 1998.

J. N. Mait, Diffractive Lens Fabricated with Binary Features Less than 60 Nm, Optics Letters, vol.25, issue.6, pp.1539-4794, 2000.

J. Alda, Design of Fresnel Lenses and Binary-Staircase Kinoforms of Low Value of the Aperture Number, Optics Communications, vol.260, pp.454-461

B. E. Saleh and M. C. Teich, Fundamentals of Photonics, vol.1200, 2007.

V. Rochus, Pixel Performance Enhancement by Integrated Diffractive Optics, International Image Sensor Workshop, 2015.

H. Alaibakhsh and M. A. Karami, Numerical Study of a Fresnel Zone Plate Based Lens for a 2 M m X 2 M m CMOS Image Sensor Pixel, vol.127, pp.30-4026

G. Lippmann, « Épreuves Réversibles Donnant La Sensation Du Relief, J. Phys. Theor. Appl, vol.7, issue.1, pp.821-825, 1908.

E. H. Adelson and J. Y. Wang, « Single Lens Stereo with a Plenoptic Camera, IEEE Transactions on Pattern Analysis & Machine Intelligence, vol.2, pp.99-106, 1992.

V. Drazic, Optimal Design and Critical Analysis of a High Resolution Video Plenoptic Demonstrator, Proceedings of SPIE. Sous la dir. d'A. J. Woods et al. 10 fév, p.786318, 2011.

R. Ng, Light Field Photography with a Hand-Held Plenoptic Camera, Computer Science, pp.1-11, 2005.

R. Ng, « Fourier Slice Photography, ACM SIGGRAPH 2005 Papers. SIGGRAPH '05, pp.735-744, 2005.

R. Ng, Digital Light Field Photography ». AAI3219345, 2006.

T. Georgeiv, Angular Resolution Tradeoffs in Integral Photography, Proceedings of the 17th Eurographics Conference on Rendering Techniques. EGSR '06, pp.263-272, 2006.

T. G. Georgiev and A. Lumsdaine, « Superresolution with Plenoptic 2.0 Cameras ». In : Frontiers in Optics, Paper STuA6. Signal Recovery and Synthesis, p.6, 2009.

A. Lumsdaine and T. Georgiev, « The Focused Plenoptic Camera, Proc. IEEE ICCP, pp.1-8, 2009.

T. Georgiev and A. Lumsdaine, « The Multifocus Plenoptic Camera, pp.829908-829908

D. G. Dansereau, Calibration and Rectification for Lenselet-Based Plenoptic Cameras, IEEE, juin 2013, pp.1027-1034

M. Seifi, 2014 IEEE International Conference on Image Processing (ICIP). 2014 IEEE International Conference on Image Processing (ICIP), pp.5482-5486, 2014.

V. Drazic, « Optimal Depth Resolution in Plenoptic Imaging, 2010 IEEE International Conference on Multimedia and Expo (ICME). 2010 IEEE International Conference on Multimedia and Expo (ICME). Juil. 2010, pp.1588-1593

M. Kobayashi, A Low Noise and High Sensitivity Image Sensor with Imaging and Phase-Difference Detection AF in All Pixels, ITE Transactions on Media Technology and Applications, vol.4, pp.123-128, 2016.

A. Wang, Light Field Image Sensors Based on the Talbot Effect, Applied Optics, vol.48, pp.1539-4522, 2009.

A. Wang, An Angle-Sensitive CMOS Imager for Single-Sensor 3D Photography, 2011 IEEE International Solid-State Circuits Conference. 2011 IEEE International SolidState Circuits Conference. Fév, pp.412-414, 2011.

S. Sivaramakrishnan, Electron Devices Meeting (IEDM), 2011 IEEE International. Electron Devices Meeting (IEDM), 2011.

, « Image Sensor with Improved Light Sensitivity, 2005.

W. Jue, New Color Filter Arrays of High Light Sensitivity and High Demosaicking Performance, 18th IEEE International Conference on Image Processing, pp.3153-3156, 2011.

M. Rafinazari and E. Dubois, « Demosaicking Algorithm for the Kodak-RGBW Color Filter Array, pp.939503-939503, 2015.

H. Teranaka, Single-Sensor RGB and NIR Image Acquisition: Toward Optimal Performance by Taking Account of CFA Pattern, Demosaicking, and Color Correction, IS&T Electronic Imaging. Digital Photography and Mobile Imaging XII, 2016.

L. Frey, Color Filters Including Infrared Cut-off Integrated on CMOS Image Sensor, Optics Express, vol.19, pp.1094-4087, 2011.

L. Frey, Multispectral Interference Filter Arrays with Compensation of Angular Dependence or Extended Spectral Range, Optics Express, vol.23, pp.1094-4087

R. D. Jansen-van-vuuren, « Organic Photodiodes: The Future of Full Color Detection and Image Sensing, Advanced Materials, vol.28, pp.1521-4095

M. Mori, Thin Organic Photoconductive Film Image Sensors with Extremely High Saturation of 8500 Electrons/ #x00B5;m2, 2013 Symposium on VLSI Technology (VL-SIT). 2013 Symposium on VLSI Technology (VLSIT). Juin, pp.22-23, 2013.

S. Shishido, « 210ke-Saturation Signal 3um-Pixel Variable-Sensitivity Global-Shutter Organic Photoconductive Image Sensor for Motion Capture, State Circuits Conference (ISSCC), pp.112-113, 2016.

M. Takase, Pixel Global Shutter Operation by Novel Charge Control in Organic Photoconductive Film, 2015 IEEE International Electron Devices Meeting (IEDM). 2015 IEEE International Electron Devices Meeting (IEDM). Déc, 2015.

K. Nishimura, « An over 120dB Simultaneous-Capture Wide-Dynamic-Range 1.6e-Ultra-Low-Reset-Noise Organic-Photoconductive-Film CMOS Image Sensor, 2016 IEEE International Solid-State Circuits Conference (ISSCC), pp.110-111, 2016.

S. Lim, Organic-on-Silicon Complementary Metal-oxide-semiconductor Colour Image Sensors, Scientific Reports, vol.5, pp.2045-2322, 2015.

M. G. Han, « Narrow-Band Organic Photodiodes for High-Resolution Imaging, ACS Applied Materials & Interfaces (13 sept. 2016). issn, pp.1944-8244

I. J. Kramer and E. H. Sargent, « The Architecture of Colloidal Quantum Dot Solar Cells: Materials to Devices, Chemical Reviews, vol.114, pp.9-2665, 2014.

T. Rauch, Near-Infrared Imaging with Quantum-Dot-Sensitized Organic Photodiodes, Nature Photonics, vol.3, issue.6, pp.1749-4885, 2009.

J. Herrbach, Doped Organic Semiconductor: Potential Replacement for PE-DOT:PSS in Organic Photodetectors, Applied Physics Letters, vol.109, pp.3-6951

S. H. Wu, Simple near-Infrared Photodetector Based on Charge Transfer Complexes Formed in Molybdenum Oxide Doped N, physica status solidi (RRL) -Rapid Research Letters, vol.6, pp.129-131, 2012.

T. Ng, Near-Infrared Electric Power Generation Through Sub-Energy-Gap Absorption in an Organic-Inorganic Composite, Advanced Functional Materials, vol.22, pp.1616-3028

T. Ng, Charge-Transfer Complexes and Their Role in Exciplex Emission and Near-Infrared Photovoltaics, Advanced Materials, vol.26, pp.1521-4095

S. P. Wu, Formation of Charge-Transfer-Complex in Organic:metal Oxides Systems, Applied Physics Letters, vol.102, pp.1077-3118, 2013.

H. Mo, Infrared Organic Photovoltaic Device Based on Charge Transfer Interaction between Organic Materials, Organic Electronics, vol.14, pp.1566-1199, 2013.

M. Kröger, P-Type Doping of Organic Wide Band Gap Materials by Transition Metal Oxides: A Case-Study on Molybdenum Trioxide, Organic Electronics, vol.10, issue.5, pp.1566-1199, 2009.

X. Qiao, « Observation of Hole Hopping via Dopant in MoOx-Doped Organic Semiconductors: Mechanism Analysis and Application for High Performance Organic Light-Emitting Devices, Journal of Applied Physics, vol.107, pp.21-8979

T. Matsushima, Interfacial Charge Transfer and Charge Generation in Organic Electronic Devices, Organic Electronics, vol.12, pp.1566-1199, 2011.

R. Clerc, « Current Status and Challenges of the Modeling of Organic Photodiodes and Solar Cells, IEDM Proceedings. 62nd International Electron Devices Meeting, 2016.

«. 3t, Pixel for CMOS Image Sensors with Low Reset Noise and Low Dark Current Generation Utilizing Parametric Reset ». US20060203111 A1, J. Hynecek. U.S. Classification, vol.348, 2006.

. E. Us2016037099-a1 and . Mandelli, Image Sensors with Noise Reduction, 2016.

M. Ishii, An Ultra-Low Noise Photoconductive Film Image Sensor with a High-Speed Column Feedback Amplifier Noise Canceller, 2013 Symposium on VLSI Circuits. 2013 Symposium on VLSI Circuits. Juin, pp.8-9, 2013.

R. Brown and R. Q. Twiss, « A Test of a New Type of Stellar Interferometer on Sirius, Nature, vol.178, pp.28-0836, 1956.

C. Foellmi, « Intensity Interferometry and the Second-Order Correlation Function g2 in Astrophysics, Astronomy & Astrophysics, vol.507, pp.4-6361, 2009.

G. Pilyavsky, « Intensity Interferometry with Single Photon Avalanche Photodiodes, Workshop on Hanbury Brown & Twiss Interferometry : Prospects for astrophysics and quantum optics, 2014.

T. Peng-kian, Measuring Temporal Photon Bunching from a Blackbody, Workshop on Hanbury Brown & Twiss Interferometry : Prospects for astrophysics and quantum optics, 2014.

E. Horch, « Intensity Interferometry with SPAD Detectors at SCS University, 2014.

C. Barbieri, the Quantum Optics Instrument for OWL, The Scientific Requirements for Extremely Large Telescopes. Sous la dir. de P. Whitelock et al. T. 232. IAU Symposium, pp.506-507, 2006.

A. F. Moorwood, Science with the VLT in the ELT Era, 2009.

D. Dravins, Baseline Optical Intensity Interferometry -Laboratory Demonstration of Diffraction-Limited Imaging, Astronomy & Astrophysics, vol.580, issue.1