J. F. Scott, Ferroelectric Memories, 2000.
DOI : 10.1088/2058-7058/8/2/34

M. Y. Zhuravlev, R. F. Sabirianov, S. S. Jaswal, and E. Y. , Giant Electroresistance in Ferroelectric Tunnel Junctions, Physical Review Letters, vol.94, issue.24, p.246802, 2005.
DOI : 10.1063/1.1627944

URL : http://arxiv.org/abs/cond-mat/0502109

M. Dawber, K. M. Rabe, and J. F. Scott, Physics of thin-film ferroelectric oxides, Reviews of Modern Physics, vol.34, issue.4, pp.1083-1130, 2005.
DOI : 10.1016/0022-4596(92)90194-Z

URL : http://arxiv.org/abs/cond-mat/0503372

J. Valasek, Piezo-Electric and Allied Phenomena in Rochelle Salt, Physical Review, vol.17, issue.4, pp.475-481, 1921.
DOI : 10.1007/978-3-663-15884-4

R. Comès, M. Lambert, and A. Guinier, D??sordre lin??aire dans les cristaux (cas du silicium, du quartz, et des p??rovskites ferro??lectriques), Acta Crystallographica Section A, vol.26, issue.2, pp.244-254, 1970.
DOI : 10.1107/S056773947000061X

W. Cochran, Crystal stability and the theory of ferroelectricity Advances in Physics, pp.387-423, 1960.

K. M. Rabe, C. H. Ahn, and J. Triscone, Physics of ferroelectrics -a modern perspective, 2007.

R. Resta, Macroscopic polarization in crystalline dielectrics: the geometric phase approach, Reviews of Modern Physics, vol.62, issue.3, pp.899-915, 1994.
DOI : 10.1103/PhysRevLett.62.2747

R. D. King-smith and D. Vanderbilt, Theory of polarization of crystalline solids, Physical Review B, vol.43, issue.3, pp.1651-1654, 1993.
DOI : 10.1103/PhysRevLett.43.1494

J. Zak, Berry???s phase for energy bands in solids, Physical Review Letters, vol.98, issue.23, pp.2747-2750, 1989.
DOI : 10.1103/PhysRev.135.A685

W. Zhong, D. Vanderbilt, and K. M. Rabe, from First Principles, Physical Review Letters, vol.63, issue.13, pp.1861-1864, 1994.
DOI : 10.1103/PhysRevLett.63.1195

N. Choudhury, L. Walizer, S. Lisenkov, and L. Bellaiche, Geometric frustration in compositionally modulated ferroelectrics, Nature, vol.69, issue.7335, pp.513-517, 2011.
DOI : 10.1103/PhysRevLett.69.2455

URL : http://arxiv.org/abs/1110.5547

G. H. Kwei, A. C. Lawson, S. J. Billinge, and S. W. Cheong, Structures of the ferroelectric phases of barium titanate, The Journal of Physical Chemistry, vol.97, issue.10, pp.2368-2377, 1993.
DOI : 10.1021/j100112a043

E. A. Stern, Character of Order-Disorder and Displacive Components in Barium Titanate, Physical Review Letters, vol.4, issue.207, p.37601, 2004.
DOI : 10.1088/0953-8984/13/39/309

P. V. Lambeck and G. H. Jonker, Ferroelectric domain stabilization in BaTiO3 by bulk ordering of defects, Ferroelectrics, vol.21, issue.1, pp.729-731, 1978.
DOI : 10.1143/JPSJ.21.1866

Y. Wang, X. Liu, J. D. Burton, S. S. Jaswal, and E. Y. , Ferroelectric Instability Under Screened Coulomb Interactions, Physical Review Letters, vol.109, issue.24, p.247601, 2012.
DOI : 10.1063/1.3193679

URL : http://arxiv.org/abs/1208.5830

R. Moos and K. H. Hardtl, Defect Chemistry of Donor-Doped and Undoped Strontium Titanate Ceramics between 1000?? and 1400??C, Journal of the American Ceramic Society, vol.77, issue.12, pp.2549-2562, 1997.
DOI : 10.1103/PhysRevB.34.6972

Y. Mi, G. Geneste, J. E. Rault, C. Mathieu, A. Pancotti et al., (001) domains, Journal of Physics: Condensed Matter, vol.24, issue.27, p.275901, 2012.
DOI : 10.1088/0953-8984/24/27/275901

R. V. Wang, D. D. Fong, F. Jiang, M. J. Highland, P. H. Fuoss et al., Reversible Chemical Switching of a Ferroelectric Film, Physical Review Letters, vol.102, issue.4, p.47601, 2009.
DOI : 10.1016/S0921-4526(03)00273-4

J. E. Rault, G. Agnus, T. Maroutian, V. Pillard, P. Lecoeur et al., Interface electronic structure in a metal/ferroelectric heterostructure under applied bias, Physical Review B, vol.87, issue.15, p.155146, 2013.
DOI : 10.1063/1.3658453

URL : https://hal.archives-ouvertes.fr/cea-01477666

S. R. Gilbert, L. A. Wills, B. W. Wessels, J. L. Schindler, J. A. Thomas et al., Electrical transport properties of epitaxial BaTiO3 thin films, Journal of Applied Physics, vol.80, issue.2, pp.969-977, 1996.
DOI : 10.1016/0921-4534(88)90774-5

B. Matthias and A. , Domain Structure and Dielectric Response of Barium Titanate Single Crystals, Physical Review, vol.72, issue.11, pp.1378-1384, 1948.
DOI : 10.1038/160126a0

P. W. Forsbergh, Domain Structures and Phase Transitions in Barium Titanate, Physical Review, vol.74, issue.8, pp.1187-1201, 1949.
DOI : 10.1103/PhysRev.74.1134

M. J. Highland, T. T. Fister, D. D. Fong, P. H. Fuoss, C. Thompson et al., with Surface Compensation Controlled by Oxygen Partial Pressure, Physical Review Letters, vol.107, issue.18, p.187602, 2011.
DOI : 10.1103/PhysRevLett.88.016101

S. V. Kalinin and D. A. , Local potential and polarization screening on ferroelectric surfaces, Physical Review B, vol.66, issue.12, p.125411, 2001.
DOI : 10.1063/1.113841

C. Wu, P. Lee, Y. Chen, L. Chang, C. Chen et al., heterointerface, Physical Review B, vol.83, issue.2, p.20103, 2011.
DOI : 10.1063/1.2193436

J. Junquera and P. Ghosez, Critical thickness for ferroelectricity in perovskite ultrathin films, Nature, vol.44, issue.6931, pp.506-509, 2003.
DOI : 10.1063/1.366595

M. Stengel, D. Vanderbilt, and N. A. Spaldin, Enhancement of ferroelectricity at metal???oxide interfaces, Nature Materials, vol.71, issue.5, pp.392-397, 2009.
DOI : 10.1103/PhysRevB.74.060101

URL : http://arxiv.org/abs/0811.0632

I. Ponomareva, I. I. Naumov, I. Kornev, H. Fu, and L. Bellaiche, Atomistic treatment of depolarizing energy and field in ferroelectric nanostructures, Physical Review B, vol.6, issue.14, p.140102, 2005.
DOI : 10.1063/1.1513151

B. Lai, I. Ponomareva, I. Kornev, L. Bellaiche, and G. Salamo, Thickness dependency of 180?? stripe domains in ferroelectric ultrathin films: A first-principles-based study, Applied Physics Letters, vol.8, issue.15, p.152909, 2007.
DOI : 10.1103/PhysRevB.53.R5969

I. Kornev, H. Fu, and L. Bellaiche, Ultrathin Films of Ferroelectric Solid Solutions under a Residual Depolarizing Field, Physical Review Letters, vol.93, issue.19, p.196104, 2004.
DOI : 10.1038/nature01538

C. B. Eom, R. J. Cava, R. M. Fleming, J. M. Phillips, R. B. Vandover et al., Single-Crystal Epitaxial Thin Films of the Isotropic Metallic Oxides Sr1-xCaxRuO3 (0 le x le 1), Science, vol.258, issue.5089, pp.1766-1769, 1992.
DOI : 10.1126/science.258.5089.1766

D. G. Schlom, L. Chen, C. Eom, K. M. Rabe, S. K. Streiffer et al., Strain Tuning of Ferroelectric Thin Films, Annual Review of Materials Research, vol.37, issue.1, pp.589-626, 2007.
DOI : 10.1146/annurev.matsci.37.061206.113016

C. B. Eom, R. B. Dover, J. M. Phillips, D. J. Werder, J. H. Marshall et al., ) isotropic metallic oxide electrodes, Applied Physics Letters, vol.8, issue.18, pp.2570-2572, 1993.
DOI : 10.1063/1.109474

J. Wang, H. Zheng, Z. Ma, S. Prasertchoung, M. Wuttig et al., Epitaxial BiFeO3 thin films on Si, Applied Physics Letters, vol.85, issue.13, pp.2574-2576, 2004.
DOI : 10.1063/1.1764944

T. Kojima, T. Sakai, T. Watanabe, H. Funakubo, K. Saito et al., Large remanent polarization of (Bi,Nd)4Ti3O12 epitaxial thin films grown by metalorganic chemical vapor deposition, Applied Physics Letters, vol.80, issue.15, pp.2746-2748, 2002.
DOI : 10.1080/10584580008215654

K. Takahashi, M. Suzuki, T. Kojima, T. Watanabe, Y. Sakashita et al., Thickness dependence of dielectric properties in bismuth layer-structured dielectrics, Applied Physics Letters, vol.748, issue.8, p.82901, 2006.
DOI : 10.1016/0025-5408(95)00161-1

Q. Gan, R. A. Rao, C. B. Eom, L. Wu, and F. Tsui, Lattice distortion and uniaxial magnetic anisotropy in single domain epitaxial (110) films of SrRuO3, Journal of Applied Physics, vol.85, issue.8, pp.5297-5299, 1999.
DOI : 10.1063/1.119616

C. W. Jones, P. D. Battle, P. Lightfoot, and W. T. Harrison, The structure of SrRuO3 by time-of-flight neutron powder diffraction, Acta Crystallographica Section C Crystal Structure Communications, vol.45, issue.3, pp.365-367, 1989.
DOI : 10.1107/S0108270188012077

K. J. Choi, S. H. Baek, H. W. Jang, L. J. Belenky, M. Lyubchenko et al., Thin Films, Advanced Materials, vol.61, issue.6, pp.759-762, 2010.
DOI : 10.1002/adma.200902355

URL : https://hal.archives-ouvertes.fr/hal-00315845

M. Izuha, K. Abe, and N. Fukushima, ) Capacitors, Japanese Journal of Applied Physics, vol.36, issue.Part 1, No. 9B, pp.5866-5869, 1997.
DOI : 10.1143/JJAP.36.5866

V. Nagarajan, J. Junquera, J. Q. He, C. L. Jia, R. Waser et al., Scaling of structure and electrical properties in ultrathin epitaxial ferroelectric heterostructures, Journal of Applied Physics, vol.83, issue.5, p.51609, 2006.
DOI : 10.1063/1.124056

P. A. Cox, R. G. Egdell, J. B. Goodenough, A. Hamnett, and C. C. Naish, The metal-to-semiconductor transition in ternary ruthenium (IV) oxides: a study by electron spectroscopy, Journal of Physics C: Solid State Physics, vol.16, issue.32, p.6221, 1983.
DOI : 10.1088/0022-3719/16/32/014

D. J. Singh, Electronic and magnetic properties of the 4d itinerant ferromagnet SrRuO3, Journal of Applied Physics, vol.44, issue.144, pp.4818-4820, 1996.
DOI : 10.1063/1.361618

V. J. Emery and S. A. Kivelson, Superconductivity in Bad Metals, Physical Review Letters, vol.65, issue.240, pp.3253-3256, 1995.
DOI : 10.1103/PhysRevLett.74.1430

I. P. Batra, P. Wurfel, and B. D. Silverman, Depolarization Field and Stability Considerations in Thin Ferroelectric Films, Journal of Vacuum Science and Technology, vol.10, issue.5, pp.687-692, 1973.
DOI : 10.1116/1.1318414

R. Ramesh and N. A. Spaldin, Multiferroics: progress and prospects in thin films, Nature Materials, vol.2, issue.1, pp.21-29, 2007.
DOI : 10.1016/S0038-1098(02)00087-X

D. G. Schlom, L. Chen, X. Pan, A. Schmehl, and M. A. Zurbuchen, A Thin Film Approach to Engineering Functionality into Oxides, Journal of the American Ceramic Society, vol.77, issue.[4], pp.2429-2454, 2008.
DOI : 10.1103/PhysRevLett.101.107602

K. J. Choi, M. Biegalski, Y. L. Li, A. Sharan, J. Schubert et al., Enhancement of Ferroelectricity in Strained BaTiO3 Thin Films, Science, vol.306, issue.5698, pp.1005-1009, 2004.
DOI : 10.1126/science.1103218

M. Bibes, Nanoferronics is a winning combination, Nature Materials, vol.85, issue.5, pp.354-357, 2012.
DOI : 10.1103/PhysRevB.85.064105

J. F. Scott, Applications of Modern Ferroelectrics, Science, vol.315, issue.5814, pp.954-959, 2007.
DOI : 10.1126/science.1129564

V. Garcia, S. Fusil, K. Bouzehouane, S. Enouz-vedrenne, N. D. Mathur et al., Giant tunnel electroresistance for non-destructive readout of ferroelectric states, Nature, vol.79, issue.7251, pp.81-84, 2009.
DOI : 10.1038/nature08128

R. R. Mehta, B. D. Silverman, and J. T. Jacobs, Depolarization fields in thin ferroelectric films, Journal of Applied Physics, vol.117, issue.8, pp.3379-3385, 1973.
DOI : 10.1103/PhysRev.152.683

V. Garcia and M. Bibes, Ferroelectric tunnel junctions for information storage and processing, Nature Communications, vol.112, p.4289, 2014.
DOI : 10.1063/1.4749267

N. Sai, A. M. Kolpak, and A. M. Rappe, Ferroelectricity in ultrathin perovskite films, Physical Review B, vol.72, issue.2, p.20101, 2005.
DOI : 10.1103/PhysRevLett.30.384

URL : http://arxiv.org/pdf/cond-mat/0505051

Y. Umeno, B. Meyer, C. Elsässer, and P. Gumbsch, films, Physical Review B, vol.34, issue.6, p.60101, 2006.
DOI : 10.1039/a903029h

B. Meyer and D. Vanderbilt, surfaces in external electric fields, Physical Review B, vol.55, issue.288, p.205426, 2001.
DOI : 10.1103/PhysRevB.60.836

S. Prosandeev, S. Lisenkov, and L. Bellaiche, Ultrathin Films: A First-Principles-Based Study, Physical Review Letters, vol.8, issue.14, p.147603, 2010.
DOI : 10.1038/nnano.2009.293

E. Almahmoud, Dependence of Curie temperature on the thickness of an ultrathin ferroelectric film, Physical Review B, vol.81, issue.6, 2010.
DOI : 10.1103/PhysRevLett.80.4783

URL : https://hal.archives-ouvertes.fr/hal-00580765

D. D. Fong, G. B. Stephenson, S. K. Streiffer, J. A. Eastman, O. Auciello et al., Ferroelectricity in Ultrathin Perovskite Films, Science, vol.304, issue.5677, pp.1650-1653, 2004.
DOI : 10.1126/science.1098252

H. Béa, S. Fusil, K. Bouzehouane, M. Bibes, M. Sirena et al., Epitaxial Thin Films, Japanese Journal of Applied Physics, vol.45, issue.No. 7, pp.187-189, 2006.
DOI : 10.1143/JJAP.45.L187

Y. H. Chu, T. Zhao, M. P. Cruz, Q. Zhan, P. L. Yang et al., Ferroelectric size effects in multiferroic BiFeO3 thin films, Applied Physics Letters, vol.90, issue.25, p.252906, 2007.
DOI : 10.1063/1.1914950

V. Garcia, M. Bibes, L. Bocher, S. Valencia, F. Kronast et al., Ferroelectric Control of Spin Polarization, Science, vol.80, issue.13, pp.1106-1110, 2010.
DOI : 10.1103/PhysRevLett.95.137203

D. H. Kim, H. N. Lee, M. D. Biegalski, and H. M. Christen, Effect of epitaxial strain on ferroelectric polarization in multiferroic BiFeO[sub 3] films, Applied Physics Letters, vol.92, issue.1, p.12911, 2008.
DOI : 10.1080/14786436208214471

C. Lichtensteiger, J. Triscone, J. Junquera, and P. Ghosez, Films, Physical Review Letters, vol.150, issue.4, p.47603, 2005.
DOI : 10.1103/PhysRevB.55.6161

URL : https://hal.archives-ouvertes.fr/hal-00601348

T. Tybell, C. H. Ahn, and J. Triscone, Ferroelectricity in thin perovskite films, Applied Physics Letters, vol.75, issue.6, pp.856-858, 1999.
DOI : 10.1080/10584589708013006

F. Rao, M. Kim, A. J. Freeman, S. Tang, and M. Anthony, (001) interfaces, Physical Review B, vol.71, issue.20, pp.13953-13960, 1997.
DOI : 10.1103/PhysRev.71.717

H. Kohlstedt, N. A. Pertsev, J. R. Contreras, and R. Waser, Theoretical current-voltage characteristics of ferroelectric tunnel junctions, Physical Review B, vol.59, issue.12, p.125341, 2005.
DOI : 10.1016/S0022-0248(02)01985-1

URL : http://arxiv.org/abs/cond-mat/0503546

C. Duan, S. S. Jaswal, and E. Y. , Multilayers: Ferroelectric Control of Magnetism, Physical Review Letters, vol.136, issue.4, p.47201, 2006.
DOI : 10.1103/PhysRevLett.96.107603

N. Bergeard, M. G. Silly, D. Krizmancic, C. Chauvet, M. Guzzo et al., Time-resolved photoelectron spectroscopy using synchrotron radiation time structure, Journal of Synchrotron Radiation, vol.70, issue.503, pp.245-250, 2011.
DOI : 10.1103/PhysRevB.70.233106

E. Bauer, A brief history of PEEM, Journal of Electron Spectroscopy and Related Phenomena, vol.185, issue.10, pp.314-322, 2012.
DOI : 10.1016/j.elspec.2012.08.001

D. I. Bilc, F. D. Novaes, J. Iñiguez, P. Ordejón, and P. Ghosez, Electroresistance Effect in Ferroelectric Tunnel Junctions with Symmetric Electrodes, ACS Nano, vol.6, issue.2, pp.1473-1478, 2012.
DOI : 10.1021/nn2043324

M. Born, Eine thermochemischemische anwendung der gittertheorie, Verh Dutsch Physik Ges, pp.13-24, 1919.

E. Bauer, Low energy electron microscopy, Reports on Progress in Physics, vol.57, issue.9, p.895, 1994.
DOI : 10.1088/0034-4885/57/9/002

A. Pancotti, J. Wang, P. Chen, L. Tortech, C. Teodorescu et al., X-ray photoelectron diffraction study of relaxation and rumpling of ferroelectric domains in BaTiO, Physical Review B, vol.3, issue.87, p.184116, 2013.
URL : https://hal.archives-ouvertes.fr/cea-01477579

Y. Ishibashi and Y. Takagi, Note on Ferroelectric Domain Switching, Journal of the Physical Society of Japan, vol.31, issue.2, pp.506-510, 1971.
DOI : 10.1143/JPSJ.31.506

A. Kolmogorov, A statistical theory for the recrystallisation of metals, Izv. Akad. Nauk. SSSR, vol.3, 1937.

M. Avrami, Kinetics of Phase Change. I General Theory, The Journal of Chemical Physics, vol.22, issue.12, pp.1103-1112, 1939.
DOI : 10.1002/zaac.19332140411

M. Arenstein, Instability in Crystals and Thermal Expansion Coefficients, Physical Review, vol.271, issue.4A, pp.1034-1037, 1964.
DOI : 10.1098/rspa.1963.0011

A. K. Tagantsev, I. Stolichnov, N. Setter, J. S. Cross, and M. Tsukada, Non-Kolmogorov-Avrami switching kinetics in ferroelectric thin films, Physical Review B, vol.7, issue.21, p.214109, 2002.
DOI : 10.1080/14786436208214471

D. J. Jung, M. Dawber, A. Ruediger, J. F. Scott, H. H. Kim et al., Dielectric loss peak due to platinum electrode porosity in lead zirconate titanate thin-film capacitors, Applied Physics Letters, vol.81, issue.13, pp.2436-2438, 2002.
DOI : 10.1557/PROC-433-145

M. Dawber, D. J. Jung, and J. F. Scott, Perimeter effect in very small ferroelectrics, Applied Physics Letters, vol.33, issue.3, pp.436-438, 2003.
DOI : 10.1063/1.355875

S. Tiedke, T. Schmitz, K. Prume, A. Roelofs, T. Schneller et al., Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope, Applied Physics Letters, vol.32, issue.22, pp.3678-3680, 2001.
DOI : 10.1063/1.364991

S. Prasertchoung, V. Nagarajan, Z. Ma, R. Ramesh, J. S. Cross et al., Polarization switching of submicron ferroelectric capacitors using an atomic force microscope, Applied Physics Letters, vol.38, issue.16, pp.3130-3132, 2004.
DOI : 10.1143/JJAP.39.4059

C. B. Sawyer and C. H. Tower, Rochelle Salt as a Dielectric, Physical Review, vol.LXV, issue.3, pp.269-273, 1930.
DOI : 10.1126/science.65.1679.235-a

R. Bouregba, B. Vilquin, G. L. Rhun, G. Poullain, and B. Domenges, Sawyer???Tower hysteresis measurements on micron sized Pb(Zr,Ti)O3 capacitors, Review of Scientific Instruments, vol.74, issue.10, pp.4429-4435, 2003.
DOI : 10.1080/00150190213947

J. F. Scott, Ferroelectrics go bananas, Journal of Physics: Condensed Matter, vol.20, issue.2, p.21001, 2008.
DOI : 10.1088/0953-8984/20/02/021001

S. D. Traynor, T. D. Hadnagy, and L. Kammerdiner, Capacitor test simulation of retention and imprint characteristics for ferroelectric memory operation, Integrated Ferroelectrics, vol.16, issue.1-4, pp.63-76, 1997.
DOI : 10.1080/10584589508013588

N. Abe, T. Yanase, and . Kawakubo, Thin Film Capacitor, Japanese Journal of Applied Physics, vol.39, issue.Part 1, No. 7A, pp.4059-4063, 2000.
DOI : 10.1143/JJAP.39.4059

H. Ishii, T. Nakajima, Y. Takahashi, and T. Furukawa, Ultrafast Polarization Switching in Ferroelectric Polymer Thin Films at Extremely High Electric Fields, Applied Physics Express, vol.4, issue.3, p.31501, 2011.
DOI : 10.1143/APEX.4.031501

S. Zhukov, Y. A. Genenko, O. Hirsch, J. Glaum, T. Granzow et al., Dynamics of polarization reversal in virgin and fatigued ferroelectric ceramics by inhomogeneous field mechanism, Physical Review B, vol.145, issue.1, p.14109, 2010.
DOI : 10.1063/1.1801679

C. J. Brennan, Characterization and modelling of thin-film ferroelectric capacitors using C-V analysis, Integrated Ferroelectrics, vol.2, issue.1-4, pp.73-82, 1992.
DOI : 10.1080/10584589208215733

L. Pintilie and M. Alexe, Metal-ferroelectric-metal heterostructures with Schottky contacts. I. Influence of the ferroelectric properties, Journal of Applied Physics, vol.14, issue.12, p.124103, 2005.
DOI : 10.1063/1.1627944

URL : http://arxiv.org/abs/cond-mat/0508570

L. Pintilie, I. Boerasu, M. J. Gomes, T. Zhao, R. Ramesh et al., Metal-ferroelectric-metal structures with Schottky contacts. II. Analysis of the experimental current-voltage and capacitance-voltage characteristics of Pb(Zr,Ti)O3 thin films, Journal of Applied Physics, vol.5, issue.12, p.124104, 2005.
DOI : 10.1038/nature01501

URL : http://arxiv.org/abs/cond-mat/0508570

L. Pintilie, I. Vrejoiu, D. Hesse, G. Lerhun, and M. Alexe, films, Physical Review B, vol.99, issue.10, p.104103, 2007.
DOI : 10.1116/1.590208

URL : https://hal.archives-ouvertes.fr/hal-00513701

E. Soergel, Piezoresponse force microscopy (PFM), Journal of Physics D: Applied Physics, vol.44, issue.46, p.464003, 2011.
DOI : 10.1088/0022-3727/44/46/464003

A. Gruverman, D. Wu, and J. F. Scott, Piezoresponse Force Microscopy Studies of Switching Behavior of Ferroelectric Capacitors on a 100-ns Time Scale, Physical Review Letters, vol.3, issue.9, p.97601, 2008.
DOI : 10.1103/PhysRevLett.99.267602

B. B. Tian, J. L. Wang, S. Fusil, Y. Liu, X. L. Zhao et al., Tunnel electroresistance through organic ferroelectrics, Nature Communications, vol.103, p.11502, 2016.
DOI : 10.1063/1.4816749

URL : https://hal.archives-ouvertes.fr/hal-01385275

H. Hertz, Ueber einen Einfluss des ultravioletten Lichtes auf die electrische Entladung, Annalen der Physik und Chemie, vol.31, issue.8, pp.983-1000, 1887.
DOI : 10.1002/andp.18872670707

A. Einstein, ??ber einen die Erzeugung und Verwandlung des Lichtes betreffenden heuristischen Gesichtspunkt, Annalen der Physik, vol.12, issue.6, pp.132-148, 1905.
DOI : 10.1002/andp.19053220607

A. H. Compton, A Quantum Theory of the Scattering of X-rays by Light Elements, Physical Review, vol.41, issue.5, pp.483-502, 1923.
DOI : 10.1080/14786440108635619

C. Nordling, E. Sokolowski, and K. Siegbahn, Precision Method for Obtaining Absolute Values of Atomic Binding Energies, Physical Review, vol.1, issue.5, pp.1676-1677, 1957.
DOI : 10.1103/RevModPhys.25.691

J. C. Woicik, Hard X-ray Photoelectron Spectroscopy (HAXPES), 2015.
DOI : 10.1007/978-3-319-24043-5

P. H. Citrin and G. K. Wertheim, Photoemission from surface-atom core levels, surface densities of states, and metal-atom clusters: A unified picture, Physical Review B, vol.47, issue.6, pp.3176-3200, 1983.
DOI : 10.1103/PhysRevLett.47.1913

R. Courths and S. Hüfner, Photoemission experiments on copper, Physics Reports, vol.112, issue.2, pp.53-171, 1984.
DOI : 10.1016/0370-1573(84)90167-4

S. Hüfner, Photoelectron spectroscopy, 2003.

C. S. Fadley, R. J. Baird, W. Siekhaus, T. Novakov, and S. A. Bergström, Surface analysis and angular distributions in x-ray photoelectron spectroscopy, Journal of Electron Spectroscopy and Related Phenomena, vol.4, issue.2, pp.93-137, 1974.
DOI : 10.1016/0368-2048(74)90001-2

C. S. Fadley, Angle-resolved x-ray photoelectron spectroscopy, Progress in Surface Science, vol.16, issue.3, pp.275-388, 1984.
DOI : 10.1016/0079-6816(84)90001-7

I. Adawi, Theory of the Surface Photoelectric Effect for One and Two Photons, Physical Review, vol.33, issue.3A, pp.788-798, 1964.
DOI : 10.1088/0370-1298/64/2/305

J. B. Pendry, Theory of photoemission, Surface Science, vol.57, issue.2, pp.679-705, 1976.
DOI : 10.1016/0039-6028(76)90355-1

URL : https://hal.archives-ouvertes.fr/jpa-00217452

T. Koopmans, ??ber die Zuordnung von Wellenfunktionen und Eigenwerten zu den Einzelnen Elektronen Eines Atoms, Physica, vol.1, issue.1-6, pp.104-113, 1934.
DOI : 10.1016/S0031-8914(34)90011-2

J. J. Yeh and I. Lindau, Atomic subshell photoionization cross sections and asymmetry parameters: 1 ? Z ? 103 Atomic Data and Nuclear Data Tables, pp.1-155, 1985.
DOI : 10.1016/0092-640x(85)90016-6

J. H. Hubbell, H. A. Gimm, and I. , =1 to 100, Journal of Physical and Chemical Reference Data, vol.9, issue.4, pp.1023-1148, 1980.
DOI : 10.1063/1.555629

URL : https://hal.archives-ouvertes.fr/jpa-00214604

D. A. Shirley, High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of Gold, Physical Review B, vol.26, issue.12, pp.4709-4714, 1972.
DOI : 10.1103/PhysRevLett.26.1108

F. Haber, Theory of the heat of reaction, Verhandl Deut Phys Ges, vol.21, pp.750-768, 1919.

G. M. Vanacore, L. F. Zagonel, and N. Barrett, Surface enhanced covalency and Madelung potentials in Nb doped SrTiO3 (100), (110) and (111) single crystals, Surface Science, vol.604, issue.19-20, pp.1674-1683, 2010.
DOI : 10.1016/j.susc.2010.06.012

L. Kornblum, J. A. Rothschild, Y. Kauffmann, R. Brener, and M. Eizenberg, interfaces, Physical Review B, vol.84, issue.15, p.155317, 2011.
DOI : 10.1063/1.1635656

K. Horn, Photoemission studies of barrier heights in metal???semiconductor interfaces and heterojunctions, Applied Surface Science, vol.166, issue.1-4, pp.1-11, 2000.
DOI : 10.1016/S0169-4332(00)00435-9

K. Horn, M. Moreno, M. Alonso, M. Höricke, R. Hey et al., Photoelectron emission from heterojunctions with intralayers: band-offset changes vs. band-bending effects, Vacuum, vol.67, issue.1, pp.115-123, 2002.
DOI : 10.1016/S0042-207X(02)00198-7

L. Q. Zhu, N. Barrett, P. Jegou, F. Martin, C. Leroux et al., X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy investigation of Al-related dipole at the HfO2/Si interface, Journal of Applied Physics, vol.5, issue.2, p.24102, 2009.
DOI : 10.1063/1.2884333

J. H. Lambert, Photometria, sive de mensura et gradibus luminis, colorum et umbrae

C. R. Brundle, Elucidation of surface structure and bonding by photoelectron spectroscopy?, Surface Science, vol.48, issue.1, pp.99-136, 1975.
DOI : 10.1016/0039-6028(75)90312-X

G. Panaccione and K. Kobayashi, Hard X-ray photoemission spectroscopy: Variable depth analysis of bulk, surface and interface electronic properties, Surface Science, vol.606, issue.3-4, pp.125-129, 2012.
DOI : 10.1016/j.susc.2011.10.022

C. S. Fadley, X-ray photoelectron spectroscopy: Progress and perspectives, Journal of Electron Spectroscopy and Related Phenomena, vol.178, issue.179, pp.2-32, 2010.
DOI : 10.1016/j.elspec.2010.01.006

K. Kobayashi, Hard X-ray photoemission spectroscopy, Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol.601, issue.1-2, p.32, 2009.
DOI : 10.1016/j.nima.2008.12.188

W. Smekal, W. S. Werner, and C. J. Powell, Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger-electron spectroscopy and X-ray photoelectron spectroscopy, Surface and Interface Analysis, vol.26, issue.11, pp.1059-1067, 2005.
DOI : 10.1088/0370-1298/69/5/305

S. Suzer, E. Abelev, and S. L. Bernasek, Impedance-type measurements using XPS, Applied Surface Science, vol.256, issue.5, pp.1296-1298, 2009.
DOI : 10.1016/j.apsusc.2009.10.029

URL : http://repository.bilkent.edu.tr/bitstream/11693/11762/1/10.1016-j.apsusc.2009.10.029.pdf

T. Nagata, M. Haemori, Y. Yamashita, H. Yoshikawa, Y. Iwashita et al., Oxygen migration at Pt/HfO2/Pt interface under bias operation, Applied Physics Letters, vol.10, issue.8, p.82902, 2010.
DOI : 10.1063/1.2721384

T. Nagata, M. Haemori, Y. Yamashita, H. Yoshikawa, Y. Iwashita et al., /Pt resistive random access memory structure, Applied Physics Letters, vol.99, issue.22, p.223517, 2011.
DOI : 10.1116/1.1376699

F. Chen and A. Klein, Polarization dependence of Schottky barrier heights at interfaces of ferroelectrics determined by photoelectron spectroscopy, Physical Review B, vol.86, issue.9, p.94105, 2012.
DOI : 10.1103/PhysRevB.73.245312

E. Brüche, Elektronenmikroskopische abbildung mit lichtelektrischen elektronen, Zeitschrift für Physik, pp.448-450, 1933.

G. F. Rempfer and O. Griffith, Emission microscopy and related techniques: Resolution in photoelectron microscopy, low energy electron microscopy and mirror electron microscopy, Ultramicroscopy, vol.47, issue.1-3, pp.35-54, 1992.
DOI : 10.1016/0304-3991(92)90184-L

W. Telieps and E. Bauer, An analytical reflection and emission UHV surface electron microscope, Ultramicroscopy, vol.17, issue.1, pp.57-65, 1985.
DOI : 10.1016/0304-3991(85)90177-9

J. Stohr, Y. Wu, B. D. Hermsmeier, M. G. Samant, G. R. Harp et al., Element-Specific Magnetic Microscopy with Circularly Polarized X- Rays, Science, vol.259, pp.658-661, 1993.

M. Escher, K. Winkler, O. Renault, and N. Barrett, Applications of high lateral and energy resolution imaging XPS with a double hemispherical analyser based spectromicroscope, Journal of Electron Spectroscopy and Related Phenomena, vol.178, issue.179, pp.178-179, 2010.
DOI : 10.1016/j.elspec.2009.06.001

E. Bauer, Photoelectron spectromicroscopy: present and future, Journal of Electron Spectroscopy and Related Phenomena, vol.114, issue.116, pp.975-987, 2001.
DOI : 10.1016/S0368-2048(00)00261-9

B. P. Tonner, D. Dunham, T. Droubay, and M. Pauli, A photoemission microscope with a hemispherical capacitor energy filter, Journal of Electron Spectroscopy and Related Phenomena, vol.84, issue.1-3, pp.211-229, 1997.
DOI : 10.1016/S0368-2048(97)00005-4

R. M. Tromp, J. B. Hannon, A. W. Ellis, W. Wan, A. Berghaus et al., A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design, Ultramicroscopy, vol.110, issue.7, pp.852-861, 2010.
DOI : 10.1016/j.ultramic.2010.03.005

M. Escher, N. Weber, M. Merkel, C. Ziethen, P. Bernhard et al., Nanoelectron spectroscopy for chemical analysis: a novel energy filter for imaging x-ray photoemission spectroscopy, Journal of Physics: Condensed Matter, vol.17, issue.16, p.1329, 2005.
DOI : 10.1088/0953-8984/17/16/004

L. F. Zagonel, N. Barrett, O. Renault, A. Bailly, M. Bäurer et al., n situ annealed strontium titanate, Surface and Interface Analysis, vol.136, issue.13, pp.1709-1712, 2008.
DOI : 10.1002/sia.2886

A. Damascelli, Probing the Electronic Structure of Complex Systems by ARPES, Physica Scripta, vol.109, p.61, 2004.
DOI : 10.1238/Physica.Topical.109a00061

M. Patt, C. Wiemann, N. Weber, M. Escher, A. Gloskovskii et al., Bulk sensitive hard x-ray photoemission electron microscopy, Review of Scientific Instruments, vol.1984, issue.11, p.113704, 2014.
DOI : 10.1002/sia.740111208

A. Chanthbouala, V. Garcia, R. O. Cherifi, K. Bouzehouane, S. Fusil et al., A ferroelectric memristor, Nature Materials, vol.83, issue.10, pp.860-864, 2012.
DOI : 10.1063/1.1621731

URL : http://arxiv.org/pdf/1206.3397

C. H. Ahn, R. H. Hammond, T. H. Geballe, M. R. Beasley, J. Triscone et al., Ferroelectric field effect in ultrathin SrRuO3 films, Applied Physics Letters, vol.70, issue.2, pp.206-208, 1997.
DOI : 10.1088/0022-3719/16/32/014

X. D. Wu, S. R. Foltyn, R. C. Dye, Y. Coulter, and R. E. Muenchausen, thin films, Applied Physics Letters, vol.14, issue.19, pp.2434-2436, 1993.
DOI : 10.1016/0025-5408(72)90075-X

URL : https://hal.archives-ouvertes.fr/hal-01468506

C. L. Chen, Y. Cao, Z. J. Huang, Q. D. Jiang, Z. Zhang et al., Epitaxial SrRuO3 thin films on (001) SrTiO3, Applied Physics Letters, vol.79, issue.8, pp.1047-1049, 1997.
DOI : 10.1063/1.1729050

B. Chrisey and K. Graham, Pulsed laser deposition of thin films, 1994.

F. Granozio, In situ investigation of surface oxygen vacancies in perovskites, Materials Research Society Symposium Proceedings, 2006.

G. J. Rijnders, G. Koster, D. H. Blank, and H. Rogalla, monitoring during pulsed laser deposition of complex oxides using reflection high energy electron diffraction under high oxygen pressure, Applied Physics Letters, vol.65, issue.14, pp.1888-1890, 1997.
DOI : 10.1103/PhysRevB.50.8122

M. Stengel, P. Aguado-puente, N. A. Spaldin, and J. Junquera, Band alignment at metal/ferroelectric interfaces: Insights and artifacts from first principles, Physical Review B, vol.243, issue.23, p.235112, 2011.
DOI : 10.1103/PhysRevB.55.10355

URL : http://arxiv.org/abs/1103.0504

A. K. Tagantsev, G. Gerra, and N. Setter, Short-range and long-range contributions to the size effect in metal-ferroelectric-metal heterostructures, Physical Review B, vol.51, issue.17, p.174111, 2008.
DOI : 10.1063/1.1861517

A. K. Tagantsev and G. Gerra, Interface-induced phenomena in polarization response of ferroelectric thin films, Journal of Applied Physics, vol.22, issue.5, p.51607, 2006.
DOI : 10.1080/10584580390258282

C. T. Black and J. J. Welser, Electric-field penetration into metals: consequences for high-dielectric-constant capacitors, IEEE Transactions on Electron Devices, vol.46, issue.4, pp.776-780, 1999.
DOI : 10.1109/16.753713

J. Shin, A. Y. Borisevich, V. Meunier, J. Zhou, E. W. Plummer et al., Interface, ACS Nano, vol.4, issue.7, pp.4190-4196, 2010.
DOI : 10.1021/nn1008337

URL : https://hal.archives-ouvertes.fr/inria-00401746

M. Kawasaki, K. Takahashi, T. Maeda, R. Tsuchiya, M. Shinohara et al., Atomic Control of the SrTiO3 Crystal Surface, Science, vol.266, issue.5190, pp.1540-1542, 1994.
DOI : 10.1126/science.266.5190.1540

X. J. Lou, Polarization fatigue in ferroelectric thin films and related materials, Journal of Applied Physics, vol.1, issue.2, p.24101, 2009.
DOI : 10.1209/epl/i2005-10193-0

E. Kröger, A. Petraru, A. Quer, R. Soni, M. Kalläne et al., hard x-ray photoemission spectroscopy of barrier-height control at metal/PMN-PT interfaces, Physical Review B, vol.93, issue.23, p.235415, 2016.
DOI : 10.1016/j.sna.2014.05.025

P. Ghosez, J. Michenaud, and X. Gonze, compounds, Physical Review B, vol.74, issue.2, pp.6224-6240, 1998.
DOI : 10.1103/PhysRevLett.74.4035

H. Lu, X. Liu, J. D. Burton, C. Bark, Y. Wang et al., Enhancement of Ferroelectric Polarization Stability by Interface Engineering, Advanced Materials, vol.103, issue.9, pp.1209-1216, 2012.
DOI : 10.1103/PhysRevLett.103.177601

E. A. Kraut, R. W. Grant, J. R. Waldrop, and S. P. Kowalczyk, Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials, Physical Review Letters, vol.41, issue.24, pp.1620-1623, 1980.
DOI : 10.1103/PhysRevLett.41.1425

D. Bagayoko, G. L. Zhao, J. D. Fan, and J. T. Wang, calculations of the electronic structure and optical properties of ferroelectric tetragonal, Journal of Physics: Condensed Matter, vol.10, issue.25, p.5645, 1998.
DOI : 10.1088/0953-8984/10/25/014

W. Wunderlich, H. Ohta, and K. Koumoto, Enhanced effective mass in doped SrTiO3 and related perovskites, Physica B: Condensed Matter, vol.404, issue.16, pp.2202-2212, 2009.
DOI : 10.1016/j.physb.2009.04.012

URL : http://arxiv.org/abs/cond-mat/0510013

P. Erhart and K. Albe, Modeling the electrical conductivity in BaTiO3 on the basis of first-principles calculations, Journal of Applied Physics, vol.54, issue.4, p.44315, 2008.
DOI : 10.1016/S0081-1947(08)60248-9

H. J. Chang, S. V. Kalinin, A. N. Morozovska, M. Huijben, Y. Chu et al., Atomically Resolved Mapping of Polarization and Electric Fields Across Ferroelectric/Oxide Interfaces by Z-contrast Imaging, Advanced Materials, vol.70, issue.21, pp.2474-2479, 2011.
DOI : 10.1103/PhysRevB.70.214433

M. J. Polking, M. Han, A. Yourdkhani, V. Petkov, C. F. Kisielowski et al., Ferroelectric order in individual nanometre-scale crystals, Nature Materials, vol.19, issue.8, pp.700-709, 2012.
DOI : 10.1088/0953-8984/19/33/335219

URL : http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.363.3161

D. Kan, R. Aso, H. Kurata, and Y. Shimakawa, Research Update: Interface-engineered oxygen octahedral tilts in perovskite oxide heterostructures, APL Materials, vol.23, issue.6, p.62302, 2015.
DOI : 10.1016/j.jssc.2004.02.025

URL : http://doi.org/10.1063/1.4918965

T. H. Kim, S. H. Baek, S. M. Yang, Y. S. Kim, B. C. Jeon et al., (111) capacitors, Applied Physics Letters, vol.3, issue.1, p.12905, 2011.
DOI : 10.1038/nmat2114

N. Balke, M. Gajek, A. K. Tagantsev, L. W. Martin, Y. Chu et al., Direct Observation of Capacitor Switching Using Planar Electrodes, Advanced Functional Materials, vol.75, issue.20, pp.3466-3475, 2010.
DOI : 10.1080/00150197208235760

Y. S. Kim, J. Y. Jo, D. J. Kim, Y. J. Chang, J. H. Lee et al., Ferroelectric properties of SrRuO3???BaTiO3???SrRuO3 ultrathin film capacitors free from passive layers, SrRuO 3 ultrathin film capacitors free from passive layers, p.72909, 2006.
DOI : 10.1103/PhysRevLett.95.237602

S. Yamamoto and I. Matsuda, Time-Resolved Photoelectron Spectroscopies Using Synchrotron Radiation: Past, Present, and Future, Journal of the Physical Society of Japan, vol.82, issue.2, p.21003, 2013.
DOI : 10.7566/JPSJ.82.021003

S. Doniach and M. Sunjic, Many-electron singularity in X-ray photoemission and X-ray line spectra from metals, Journal of Physics C: Solid State Physics, vol.3, issue.2, p.285, 1970.
DOI : 10.1088/0022-3719/3/2/010

L. J. Mcgilly, L. Feigl, T. Sluka, P. Yudin, A. K. Tagantsev et al., Velocity Control of 180?? Domain Walls in Ferroelectric Thin Films by Electrode Modification, Nano Letters, vol.16, issue.1, pp.68-73, 2016.
DOI : 10.1021/acs.nanolett.5b02798

N. Barrett, D. M. Gottlob, C. Mathieu, C. Lubin, J. Passicousset et al., Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions, Review of Scientific Instruments, vol.87, issue.5, p.53703, 2016.
DOI : 10.1016/j.elspec.2013.01.014

URL : https://hal.archives-ouvertes.fr/cea-01481549