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Article Dans Une Revue Ultramicroscopy Année : 2019

Design for a high resolution electron energy loss microscope

Résumé

An electron optical column has been designed for High Resolution Electron Energy Loss Microscopy (HREELM). The column is composed of electron lenses and a beam separator that are placed between an electron source based on a laser excited cesium atom beam and a time-of-flight (ToF) spectrometer or a hemispherical analyzer (HSA). The instrument will be able to perform full field low energy electron imaging of surfaces with sub-micron spatial resolution and meV energy resolution necessary for the analysis of local vibrational spectra. Thus, noncontact, real space mapping of microscopic variations in vibrational levels will be made possible. A second imaging mode will allow for the mapping of the phonon dispersion relations from microscopic regions defined by an appropriate field aperture.
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Dates et versions

hal-03021258 , version 1 (25-11-2020)

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Marian Mankos, Khashayar Shadman, Raphaël Hahn, Yan Picard, Daniel Comparat, et al.. Design for a high resolution electron energy loss microscope. Ultramicroscopy, 2019, 207, pp.112848. ⟨10.1016/j.ultramic.2019.112848⟩. ⟨hal-03021258⟩
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