2D X-ray spectrometer on WEST: diffracting crystal study and first temperature profiles
Abstract
The influence of Bragg crystals defects used on the XICS spectrometer on the Ar XVII spectra is studied in WEST. An analytical diffraction pattern routine is used to highlight 2 issues causing a line-doubling effect on spectra: a miscut angle due to the manufacturing of crystals and ambient temperature changes. The combination of both leads to angular offsets of order of the millimeter, corresponding to the spectral offset between doubled lines on experimental spectra. On another hand, the configuration of the spectrometer makes it possible to evaluate electron temperature profiles and to reveal the presence of spectral lines of Tungsten ionic species creating discrepancies between 2 intensity line ratios used, the He-like Ar resonance line w to i/ the Li-like Ar dielectronic satellite line k and ii/ the n ≥ 3 satellite lines
Domains
Nonlinear Sciences [physics]
Origin : Files produced by the author(s)