Highly robust and reliable power amplifiers in 22FDX and 45RFSOI technologies - Archive ouverte HAL Access content directly
Conference Papers Year : 2022

Highly robust and reliable power amplifiers in 22FDX and 45RFSOI technologies

(1) , (2) , (1) , (1) , (1) , (3)
1
2
3

Abstract

This paper reports the VSWR (Voltage Standing Wave Ratio) ruggedness and aging measurements of two power amplifiers designed in 22FDX and 45RFSOI technologies. The PA is one of the most critical function in a front-end module as it is operating at high power and directly impacted by mismatch load. De-rating of 20% is applied on the supply voltage to ensure the operation and durability of the power amplifiers for a 10 years lifetime. The measured and modelled degradation versus time are presented and show excellent results on both technologies.
Fichier principal
Vignette du fichier
Highly robust and reliable power amplifiers in 22FDX and 45RFSOI technologies_IEEE_OK.pdf (462.12 Ko) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

cea-03725781 , version 1 (18-07-2022)

Identifiers

  • HAL Id : cea-03725781 , version 1

Cite

Alice Bossuet, Alexis Divay, Baudouin Martineau, Cedric Dehos, Benjamin Blampey, et al.. Highly robust and reliable power amplifiers in 22FDX and 45RFSOI technologies. European Solid-state Devices and Circuits Conference Milan 2022 (ESSIRC-ESSDERC'22), Sep 2022, Milan, Italy. ⟨cea-03725781⟩
11 View
13 Download

Share

Gmail Facebook Twitter LinkedIn More