Highly robust and reliable power amplifiers in 22FDX and 45RFSOI technologies

Alice Bossuet (1) , Alexis Divay (2) , Baudouin Martineau (1) , Cedric Dehos (1) , Benjamin Blampey (1) , Yvan Morandini (3)

1 DSYS - Département Systèmes
2 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
3 SOITEC

This paper reports the VSWR (Voltage Standing Wave Ratio) ruggedness and aging measurements of two power amplifiers designed in 22FDX and 45RFSOI technologies. The PA is one of the most critical function in a front-end module as it is operating at high power and directly impacted by mismatch load. De-rating of 20% is applied on the supply voltage to ensure the operation and durability of the power amplifiers for a 10 years lifetime. The measured and modelled degradation versus time are presented and show excellent results on both technologies.

Mots clés: Reliability; Aging; power amplifier; 5G; 22FDX; 45RFSOI

Domaines: Micro et nanotechnologies/Microélectronique

Alice Bossuet, Alexis Divay, Baudouin Martineau, Cedric Dehos, Benjamin Blampey, et al.. Highly robust and reliable power amplifiers in 22FDX and 45RFSOI technologies. European Solid-state Devices and Circuits Conference Milan 2022 (ESSIRC-ESSDERC'22), Sep 2022, Milan, Italy. ⟨cea-03725781⟩