HAXPES of Al$_2$O$_3$ with Cr K$\alpha$ excitation

Pierre-Marie Deleuze (1) , Kateryna Artyushkova (2) , Eugénie Martinez (1) , Olivier Renault (1)

1 DPFT - Département Plate-Forme Technologique
2 PHI - Physical electronics

A thick alumina sample was analyzed by hard x-ray photoelectron spectroscopy (HAXPES) by means of a lab-scale spectrometer equipped with a Cr K$\alpha$ (5414.8 eV) excitation source. The reported spectra include a survey scan as well as Al 1s, Al 2s, Al 2p, O 1s and C 1s core-level spectra.

Mots clés: Al$_2$O$_3$; HAXPES; Cr K$\alpha$

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Pierre-Marie Deleuze, Kateryna Artyushkova, Eugénie Martinez, Olivier Renault. HAXPES of Al$_2$O$_3$ with Cr K$\alpha$ excitation. Surface Science Spectra, 2022, 29 (1), pp.014003. ⟨10.1116/6.0001509⟩. ⟨cea-03564243⟩