Synthesis of SiO2 Nanoparticles as reference materials : metrology measurements and in situ kinetics in lab by Small angle –X-ray scattering - Archive ouverte HAL Access content directly
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Synthesis of SiO2 Nanoparticles as reference materials : metrology measurements and in situ kinetics in lab by Small angle –X-ray scattering

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Abstract

The unambiguous correlation of possible health and sustainability risks to nanoparticle size must be enabled by reliable measurement of nanoparticle size, to ensure comparability and compatibility between results measured under different methods. The NPSIZE project funded by European Metrology Program (EMPIR) develop methods, reference materials and modelling to improve the traceability chain, comparability and compatibility of nanoparticle size measurements. In this work, we present how spherical silica nanoparticles are synthetized with controlled monomodal or bimodal dispersion to be use as reference materials and international round-robin. Improving the fabrication requires a fine understanding of synthesis (1), coupled with an expertise of in-situ or ex-situ analysis methods. This is a new challenge for the analysis : determining not only average characteristics (size, chemical composition and shape ...) but also the concentration and the distribution over the population studied (2). Small-Angle X-ray Scattering (3) allows very precise measurements of the nanoparticles size and concentration that can be directly link to the metric system (4) (metrological traceability) . We developed a SAXS laboratory instrument dedicated to the in-situ characterization of nanoparticles, which enable fast measurements, and the monitoring of the synthesis parameters. Measurement protocols and software processing chain (5) (i.e. size distribution) are also combined & optimized. TEM
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Dates and versions

cea-03448934 , version 1 (25-11-2021)

Identifiers

  • HAL Id : cea-03448934 , version 1

Cite

Olivier Taché, Benedicte Durand, Elodie Barruet, Frédéric Gobeaux, B. R. Pauw, et al.. Synthesis of SiO2 Nanoparticles as reference materials : metrology measurements and in situ kinetics in lab by Small angle –X-ray scattering. C'Nano 2020: The Nanoscience Meeting, C'Nano, Nov 2021, Toulouse, France. ⟨cea-03448934⟩
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