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Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs

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https://hal-cea.archives-ouvertes.fr/cea-03283689
Contributor : Damien Lambert <>
Submitted on : Monday, July 12, 2021 - 10:16:14 AM
Last modification on : Monday, July 26, 2021 - 3:44:42 PM

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Véronique Ferlet-Cavrois, Philippe Paillet, Marc Gaillardin, Damien Lambert, Jacques Baggio, et al.. Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2006, 53 (6), pp.3242-3252. ⟨10.1109/TNS.2006.885111⟩. ⟨cea-03283689⟩

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