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Journal articles
Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs
Véronique Ferlet-Cavrois
1
Philippe Paillet
1
Marc Gaillardin
1
Damien Lambert
1
Jacques Baggio
1
J. Schwank
2
G. Vizkelethy
2
M. Shaneyfelt
2
K. Hirose
3
E. Blackmore
4
O. Faynot
5
C. Jahan
5
L. Tosti
5
Véronique Ferlet-Cavrois 1
Author
Philippe Paillet 1
Author
Marc Gaillardin 1
Author
Damien Lambert 1
Author
L. Tosti 5
Author
1
CEA - Commissariat à l'énergie atomique et aux énergies alternatives (Centre de Saclay
Centre de Grenoble
Centre de Cadarache
etc - France)
2
SNL - Sandia National Laboratories [Albuquerque] (PO Box 5800 Albuquerque, NM 87185 - United States)
- Sandia National Laboratories - Corporation (United States)
3
ISAS - Institute of Space and Astronautical Science (Sagamihara City, Kanagawa Prefecture 252-5210 - Japan)
- JAXA - Japan Aerospace Exploration Agency [Sagamihara] (Chuo Ku, Sagamihara, Kanagawa 2525210, Japan - Japan)
4
TRIUMF [Vancouver] (4004 Wesbrook Mall, Vancouver, BC, V6T 2A3 Canada - Canada)
5
CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (MINATEC 17, rue des Martyrs, 38054, Grenoble Cedex 9 - France)
- DRT (CEA) - Direction de Recherche Technologique (CEA) : DRT (France)
- CEA - Commissariat à l'énergie atomique et aux énergies alternatives : DRT (Centre de Saclay Centre de Grenoble Centre de Cadarache etc - France)
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Journal articles
Complete list of metadata
https://hal-cea.archives-ouvertes.fr/cea-03283689
Contributor : Damien Lambert <>
Submitted on : Monday, July 12, 2021 - 10:16:14 AM
Last modification on : Monday, July 26, 2021 - 3:44:42 PM
Contributor : Damien Lambert <>
Submitted on : Monday, July 12, 2021 - 10:16:14 AM
Last modification on : Monday, July 26, 2021 - 3:44:42 PM
Identifiers
- HAL Id : cea-03283689, version 1
- DOI : 10.1109/TNS.2006.885111
Citation
Véronique Ferlet-Cavrois, Philippe Paillet, Marc Gaillardin, Damien Lambert, Jacques Baggio, et al.. Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2006, 53 (6), pp.3242-3252. ⟨10.1109/TNS.2006.885111⟩. ⟨cea-03283689⟩
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