Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs
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Damien Lambert
- Function : Author
- PersonId : 747559
- IdHAL : damien-lambert
- ORCID : 0000-0003-2150-4315
K. Hirose
- Function : Author
- PersonId : 765659
- ORCID : 0000-0003-4366-7721
- IdRef : 176588965