Skip to Main content Skip to Navigation
Journal articles

Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs

Complete list of metadata

https://hal-cea.archives-ouvertes.fr/cea-03283689
Contributor : Damien Lambert Connect in order to contact the contributor
Submitted on : Monday, July 12, 2021 - 10:16:14 AM
Last modification on : Friday, September 17, 2021 - 4:32:02 PM

Identifiers

Collections

Citation

Véronique Ferlet-Cavrois, Philippe Paillet, Marc Gaillardin, Damien Lambert, Jacques Baggio, et al.. Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2006, 53 (6), pp.3242-3252. ⟨10.1109/TNS.2006.885111⟩. ⟨cea-03283689⟩

Share

Metrics

Record views

38