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Utility of Scanning Transmission X-ray Microscopy to Investigate Chemical Composition in Perovskite Thin Films

Haeyon Jun 1 Denis Tondelier 2 Bernard Geffroy 3, 2 Jean-Eric Bourée 2 Sufal Swaraj 1 Yvan Bonnassieux 2 
1 SSOLEIL - Synchrotron SOLEIL
2 LPICM - Laboratoire de physique des interfaces et des couches minces [Palaiseau]
3 LICSEN - Laboratoire Innovation en Chimie des Surfaces et NanoSciences
NIMBE UMR 3685 - Nanosciences et Innovation pour les Matériaux, la Biomédecine et l'Energie (ex SIS2M)
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Conference poster
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https://hal-cea.archives-ouvertes.fr/cea-03123519
Contributor : Serge Palacin Connect in order to contact the contributor
Submitted on : Thursday, January 28, 2021 - 7:20:21 AM
Last modification on : Tuesday, September 27, 2022 - 4:31:53 AM
Long-term archiving on: : Thursday, April 29, 2021 - 6:14:07 PM

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  • HAL Id : cea-03123519, version 1

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CEA | X | CNRS | X-PICM | X-DEP-PHYS | LPICM | PUBNIMBE | INC-CNRS | IRAMIS-NIMBE | CEA-UPSAY | UNIV-PARIS-SACLAY | SYNCHROTRON-SOLEIL | IP_PARIS | GS-ENGINEERING | IRAMIS | GS-CHIMIE | INSTITUT-SCIENCES-LUMIERE

Citation

Haeyon Jun, Denis Tondelier, Bernard Geffroy, Jean-Eric Bourée, Sufal Swaraj, et al.. Utility of Scanning Transmission X-ray Microscopy to Investigate Chemical Composition in Perovskite Thin Films. Journées Nationales du Photovoltaïque, Jan 2021, Dourdan, France. , 2021. ⟨cea-03123519⟩

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