N.-P. Tran, J. Sandrini, A. Persico, J.-F. Nodin, T. Magis, et al.. Impact of Bottom Electrode Integration on OxRAM Arrays Variability.
VLSI-TSA - 2020 International Symposium on VLSI Technology, Systems and Applications, Aug 2020, Hsinchu, Taiwan. pp.33-34,
⟨10.1109/VLSI-TSA48913.2020.9203694⟩.
⟨cea-03027403⟩