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High-precision measurements of reflectance

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https://hal-cea.archives-ouvertes.fr/cea-02912509
Contributor : Philippe Voarino <>
Submitted on : Thursday, August 6, 2020 - 9:34:10 AM
Last modification on : Friday, August 7, 2020 - 3:50:14 AM

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Philippe Voarino, Sébastien Petitrenaud, Hervé Piombini, Frédéric Sabary, Daniel Marteau. High-precision measurements of reflectance. International Optical Design Conference, SPIE-OSA, Jun 2006, Vancouver, Canada. pp.63421Z, ⟨10.1117/12.692235⟩. ⟨cea-02912509⟩

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