 |
Journal articles
Impact of roughness of TiN bottom electrode on the forming voltage of HfO$_2$ based resistive memories
Abstract : In this work, we study the impact of roughness of TiN bottom electrode on the forming voltage of 1R TiN/HfO$_2$/Ti/TiN based ReRAM devices. A novel and atypical strategy is proposed to induce a controlled roughness of the bottom electrode, using various plasma chemistries. The forming voltage is observed to be directly linked to the roughness of the bottom electrode, over a large range of roughness values. TCAD simulation studies enable an estimate of the electrical field in the oxide inducing the forming step and confirm the dominant impact of roughness on the switching properties of ReRAM devices.
Cited literature [9 references]
https://hal-cea.archives-ouvertes.fr/cea-02862363
Contributor : Christelle Charpin-Nicolle Connect in order to contact the contributor
Submitted on : Tuesday, June 9, 2020 - 2:33:49 PM
Last modification on : Tuesday, October 19, 2021 - 11:06:20 AM
Contributor : Christelle Charpin-Nicolle Connect in order to contact the contributor
Submitted on : Tuesday, June 9, 2020 - 2:33:49 PM
Last modification on : Tuesday, October 19, 2021 - 11:06:20 AM
File
Article_CCharpinNicolle.pdf
Files produced by the author(s)