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In-situ High Temperature X-ray Diffraction Study of the Am-O System

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https://hal-cea.archives-ouvertes.fr/cea-02528988
Contributor : Florent Lebreton <>
Submitted on : Thursday, April 2, 2020 - 9:37:24 AM
Last modification on : Friday, March 5, 2021 - 1:04:01 PM

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E. Epifano, R. Belin, J-C Richaud, Romain Vauchy, M. Strach, et al.. In-situ High Temperature X-ray Diffraction Study of the Am-O System. MRS Advances, Cambridge University Press, 2016, 1 (62), pp.4133-4137. ⟨10.1557/adv.2017.200⟩. ⟨cea-02528988⟩

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