In-situ High Temperature X-ray Diffraction Study of the Am-O System

E. Epifano; R. Belin; J-C Richaud; Romain Vauchy; M. Strach; Florent Lebreton; T. Delahaye; C. Guéneau; P.M. Martin

doi:10.1557/adv.2017.200

Journal articles

In-situ High Temperature X-ray Diffraction Study of the Am-O System

E. Epifano ¹ R. Belin ¹ J-C Richaud Romain Vauchy ² M. Strach ¹ Florent Lebreton ³ T. Delahaye C. Guéneau ⁴ P.M. Martin ¹

1 CEA-DES (ex-DEN) - CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire)

2 SPUA - Service Plutonium Uranium et Actinides mineurs

3 DMRC - Département de recherche sur les procédés pour la mine et le recyclage du combustible

4 SCP - Service de Chimie Physique

DPC - Département de Physico-Chimie : DEN/DPC/SCP

Document type :

Journal articles

Domain :

Chemical Sciences / Cristallography

Chemical Sciences / Material chemistry

Physics [physics] / Condensed Matter [cond-mat] / Materials Science [cond-mat.mtrl-sci]

Complete list of metadata

https://hal-cea.archives-ouvertes.fr/cea-02528988
Contributor : Florent Lebreton Connect in order to contact the contributor
Submitted on : Thursday, April 2, 2020 - 9:37:24 AM
Last modification on : Monday, December 13, 2021 - 9:15:03 AM

In-situ High Temperature X-ray Diffraction Study of the Am-O System

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In-situ High Temperature X-ray Diffraction Study of the Am-O System

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