ToF-SIMS depth profiling of altered glass

Marie Collin (1) , S. Gin (1) , Patrick Jollivet (2) , Laurent Dupuy (3) , Vincent Dauvois (4) , Laurent Duffours (5)

1 DPME - Département de recherche sur les Procédés et Matériaux pour les Environnements complexes
2 LCLT - Laboratoire d'Etudes du Comportement à Long Terme des matériaux de conditionnement
3 Tescan Analytics
4 LRMO - Laboratoire de Radiolyse et de la Matière Organique
5 PrimeVerre

Glass and mineral corrosion usually leads to the formation of morphologically and compositionally complex surface layers that can be characterized by various analytical techniques to infer rate control mechanisms. In this study, we investigate the capabilities and limitations of time-of-flight secondary ion mass spectrometry (ToF-SIMS) to better understand chemical processes of glass corrosion. In particular, we focus on the potential impact of the ToF-SIMS ion beam on the distribution of several elements of interest in alteration layers formed on International Simple Glass, a six-oxide reference glass altered in a solution enriched in alkalis and spiked with H$_2$ $^{18}$O. A thin flake of glass partially altered on both sides is analyzed entirely from one side to the other to determine whether atoms weakly bonded to the solid are displaced by the beams. We highlight the beam effect on cations weakly bonded to the silicate network (Li, Na, K, and B, Ca, Cs to a lesser extent) affecting the profile shape of these elements. No impact is observed on $^{18}$O and H, but it is demonstrated that quantification of isotopic ratios is possible only for a limited range of isotopic enrichment.

Domaines: Physique Nucléaire Expérimentale [nucl-ex]

Marie Collin, S. Gin, Patrick Jollivet, Laurent Dupuy, Vincent Dauvois, et al.. ToF-SIMS depth profiling of altered glass. npj Materials Degradation, 2019, 3, pp.14. ⟨10.1038/s41529-019-0076-3⟩. ⟨cea-02510758⟩