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In-situ High temperature X-Ray diffraction study of the Am-O system

Abstract : In the frame of minor actinide recycling, (U,Am)O2 are promising transmutation targets. To assess the thermodynamic properties of the U-Am-O system, it is essential to have a thorough knowledge of the binary phase diagrams, which is difficult due to the lack of thermodynamic data on the Am-O system. Nevertheless, an Am-O phase diagram modelling has been recently proposed by Gotcu. Here, we show a recent investigation of the Am-O system using in-situ High Temperature X-ray Diffraction under controlled atmosphere. By coupling our experimental results with the thermodynamic calculations based on the Gotcu model, we propose for the first time a relation between the lattice parameter and the departure from stoichiometry.
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Submitted on : Wednesday, February 26, 2020 - 11:45:43 AM
Last modification on : Tuesday, April 28, 2020 - 11:28:17 AM


  • HAL Id : cea-02491617, version 1




E. Epifano, C. Guéneau, R. Belin, Jc. Richaud, M. Strach, et al.. In-situ High temperature X-Ray diffraction study of the Am-O system. MRS Scientific Basis for Nuclear Waste Management XXXIX, Nov 2015, Montpellier, France. ⟨cea-02491617⟩



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