In-situ High temperature X-Ray diffraction study of the Am-O system - Archive ouverte HAL Access content directly
Conference Papers Year : 2015

In-situ High temperature X-Ray diffraction study of the Am-O system

(1) , (1) , (1) , (1) , (1) , (1) , (1) , (1)
1

Abstract

In the frame of minor actinide recycling, (U,Am)O2 are promising transmutation targets. To assess the thermodynamic properties of the U-Am-O system, it is essential to have a thorough knowledge of the binary phase diagrams, which is difficult due to the lack of thermodynamic data on the Am-O system. Nevertheless, an Am-O phase diagram modelling has been recently proposed by Gotcu. Here, we show a recent investigation of the Am-O system using in-situ High Temperature X-ray Diffraction under controlled atmosphere. By coupling our experimental results with the thermodynamic calculations based on the Gotcu model, we propose for the first time a relation between the lattice parameter and the departure from stoichiometry.
Not file

Dates and versions

cea-02491617 , version 1 (26-02-2020)

Identifiers

  • HAL Id : cea-02491617 , version 1

Cite

E. Epifano, C. Guéneau, R. Belin, Jc. Richaud, M. Strach, et al.. In-situ High temperature X-Ray diffraction study of the Am-O system. MRS Scientific Basis for Nuclear Waste Management XXXIX, Nov 2015, Montpellier, France. ⟨cea-02491617⟩

Collections

CEA DEN
20 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More