How Advanced EBSD and Accurate-ECCI can be applied to quantify sub-boundaries induced during dislocational creep of UO_2 - Archive ouverte HAL Access content directly
Conference Papers Year : 2016

How Advanced EBSD and Accurate-ECCI can be applied to quantify sub-boundaries induced during dislocational creep of UO_2

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cea-02442296 , version 1 (16-01-2020)

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  • HAL Id : cea-02442296 , version 1

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M. Ben Saada, N. Gey, N. Maloufi, H. Mansour, B. Beausir, et al.. How Advanced EBSD and Accurate-ECCI can be applied to quantify sub-boundaries induced during dislocational creep of UO_2. EBSD Conference 2016, RMS, Mar 2016, Manchester, United Kingdom. ⟨cea-02442296⟩
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