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How Advanced EBSD and Accurate-ECCI can be applied to quantify sub-boundaries induced during dislocational creep of UO$_2$

Keywords : ECCI EBSD creep UO$_2$
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https://hal-cea.archives-ouvertes.fr/cea-02442296
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Submitted on : Thursday, January 16, 2020 - 1:40:24 PM
Last modification on : Friday, July 17, 2020 - 2:58:23 PM
Long-term archiving on: : Friday, April 17, 2020 - 2:54:05 PM

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201600001034.pdf
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  • HAL Id : cea-02442296, version 1

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M. Ben Saada, N. Gey, N. Maloufi, H. Mansour, B. Beausir, et al.. How Advanced EBSD and Accurate-ECCI can be applied to quantify sub-boundaries induced during dislocational creep of UO$_2$. EBSD 2016 - the 5th topical conference (TC) of the Microanalysis Society (MAS), Mar 2016, Manchester, United Kingdom. ⟨cea-02442296⟩

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