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Focused ion beam–scanning electron microscope examination of high burn-up UO 2 in the center of a pellet

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https://hal-cea.archives-ouvertes.fr/cea-02428764
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Submitted on : Monday, January 6, 2020 - 11:23:07 AM
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J. Noirot, I. Zacharie-Aubrun, T. Blay. Focused ion beam–scanning electron microscope examination of high burn-up UO 2 in the center of a pellet. Nuclear Engineering and Technology, 2018, 50 (2), pp.259-267. ⟨10.1016/j.net.2017.12.002⟩. ⟨cea-02428764⟩

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