Focused ion beam–scanning electron microscope examination of high burn-up UO 2 in the center of a pellet

J. Noirot; I. Zacharie-Aubrun; T. Blay

doi:10.1016/j.net.2017.12.002

Journal Articles Nuclear Engineering and Technology Year : 2018

Focused ion beam–scanning electron microscope examination of high burn-up UO 2 in the center of a pellet

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1
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J. Noirot

Function : Author
PersonId : 172301
IdHAL : jean-noirot
ORCID : 0000-0003-0334-1188

Département d'Etudes des Combustibles

CV

I. Zacharie-Aubrun

Function : Author

CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire)

T. Blay

Function : Author

CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire)

Domains

Physics [physics] Nuclear Theory [nucl-th] Physics [physics] Nuclear Experiment [nucl-ex]

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https://hal-cea.archives-ouvertes.fr/cea-02428764

Submitted on : Monday, January 6, 2020-11:23:07 AM

Last modification on : Monday, July 5, 2021-5:52:04 PM

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cea-02428764 , version 1 (06-01-2020)

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HAL Id : cea-02428764 , version 1
DOI : 10.1016/j.net.2017.12.002

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J. Noirot, I. Zacharie-Aubrun, T. Blay. Focused ion beam–scanning electron microscope examination of high burn-up UO 2 in the center of a pellet. Nuclear Engineering and Technology, 2018, 50 (2), pp.259-267. ⟨10.1016/j.net.2017.12.002⟩. ⟨cea-02428764⟩

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Focused ion beam–scanning electron microscope examination of high burn-up UO 2 in the center of a pellet

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