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Small Angle X-Rays Scattering for nanoparticles metrology and synthesis

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cea-02403842 , version 1 (11-12-2019)

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  • HAL Id : cea-02403842 , version 1

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Olivier Taché. Small Angle X-Rays Scattering for nanoparticles metrology and synthesis. Nanoparticle reference materials production & certification training course, Dec 2019, Teddington, United Kingdom. ⟨cea-02403842⟩
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