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Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses

Toshiyuki Nishiyama 1 Christoph Bostedt 2 Ken Ferguson Christopher Hutchison 3 Kiyonobu Nagaya 1 Hironobu Fukuzawa 4, 5 Koji Motomura 6 Shin-Ichi Wada 7 Tsukasa Sakai 1 Kenji Matsunami 1 Kazuhiro Matsuda Tetsuya Tachibana 6 Yuta Ito Weiqing Xu 8 Subhendu Mondal 6 Takayuki Umemoto 9 Catalin Miron 10 Christophe Nicolas 11 Takashi Kameshima 12 Yasumasa Joti 12 Kensuke Tono 13 Takaki Hatsui 13 Makina Yabashi 13 Kiyoshi Ueda 14
1 Kyoto University [Kyoto]
2 ANL - Argonne National Laboratory [Lemont]
3 Murdoch University
4 Institute of Multidisciplinary Research for Advanced Materials
5 RIKEN CBS - RIKEN Center for Brain Science [Wako]
6 Tohoku University [Sendai]
7 RIKEN RSC - RIKEN SPring-8 Center [Hyogo]
8 BUAA - Beihang University
9 Hiroshima University
10 LIDyl - Laboratoire Interactions, Dynamiques et Lasers (ex SPAM)
11 SSOLEIL - Synchrotron SOLEIL
12 JASRI - Japan Synchrotron Radiation Research Institute [Hyogo]
13 RIKEN - RIKEN - Institute of Physical and Chemical Research [Japon]
14 IMRAM
Abstract : X-ray free-electron lasers (XFELs) deliver ultrashort coherent laser pulses in the X-ray spectral regime, enabling novel investigations into the structure of individual nanoscale samples. In this work, we demonstrate how single-shot small-angle X-ray scattering (SAXS) measurements combined with fluorescence and ion time-of-flight (TOF) spectroscopy can be used to obtain size- and structure-selective evaluation of the light-matter interaction processes on the nanoscale. We recorded the SAXS images of single xenon clusters using XFEL pulses provided by the SPring-8 Angstrom compact free-electron laser (SACLA). The XFEL fluences and the radii of the clusters at the reaction point were evaluated and the ion TOF spectra and fluorescence spectra were sorted accordingly. We found that the XFEL fluence and cluster size extracted from the diffraction patterns showed a clear correlation with the fluorescence and ion TOF spectra. Our results demonstrate the effectiveness of the multispectroscopic approach for exploring laser–matter interaction in the X-ray regime without the influence of the size distribution of samples and the fluence distribution of the incident XFEL pulses.
Keywords : XFEL diffractive imaging fluorescence spectroscopy ion spectroscopy
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Journal articles
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https://hal-cea.archives-ouvertes.fr/cea-02370994
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Submitted on : Tuesday, November 19, 2019 - 4:35:30 PM
Last modification on : Monday, January 10, 2022 - 10:16:07 AM

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CEA | CEA-UPSAY | IRAMIS-LIDYL | CNRS | SYNCHROTRON-SOLEIL | IRAMIS | GS-CHIMIE | GS-ENGINEERING | INSTITUT-SCIENCES-LUMIERE

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Toshiyuki Nishiyama, Christoph Bostedt, Ken Ferguson, Christopher Hutchison, Kiyonobu Nagaya, et al.. Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses. Applied Sciences, MDPI, 2019, 9 (22), pp.4932. ⟨10.3390/app9224932⟩. ⟨cea-02370994⟩

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