ion beam analysis of light elements in thin films: common uses and capabilities

Pascal Berger; Hicham Khodja; C Raepsaet; Suzy Surblé

Conference papers

ion beam analysis of light elements in thin films: common uses and capabilities

Pascal Berger ¹ Hicham Khodja ¹ C Raepsaet ¹ Suzy Surblé ¹

1 LEEL - UMR 3685 - Laboratoire d'Etudes des Eléments Légers

NIMBE UMR 3685 - Nanosciences et Innovation pour les Matériaux, la Biomédecine et l'Energie (ex SIS2M)

Document type :

Conference papers

Domain :

Chemical Sciences / Material chemistry

Complete list of metadata

https://hal-cea.archives-ouvertes.fr/cea-02328112
Contributor : Serge Palacin Connect in order to contact the contributor
Submitted on : Wednesday, October 23, 2019 - 10:09:17 AM
Last modification on : Wednesday, December 15, 2021 - 11:20:15 AM

ion beam analysis of light elements in thin films: common uses and capabilities

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ion beam analysis of light elements in thin films: common uses and capabilities

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