Loïc Crouzier, Alexandra Delvallee, Sébastien Ducourtieux, Laurent Devoille, Guillaume Noircler, et al.. Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology.
Beilstein Journal of Nanotechnology, Karlsruhe Institute of Technology., 2019, 10, pp.1523-1536.
⟨10.3762/bjnano.10.150⟩.
⟨cea-02197596⟩