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application/pdfIEEE2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2018; ; ; phase change random access memoryPCRAMPCMmodel extractioncompact modelresistive memoryPCM compact model: Optimized methodology for model card extractionCorentin PigotFabien GilibertMarina ReybozMarc BocquetJean-Michel Portal
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)190 Sept. 2018193
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