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Conference papers
PCM compact model: Optimized methodology for model card extraction
Abstract : To achieve high yield on product embedding PCM memory, it is mandatory to provide to designers accurately
calibrated PCM compact model. To achieve this goal, it is mandatory to develop standardized model card extraction
methodology. In this paper, we present a PCM model card extraction flow based on a minimal set of static and dynamic
measurements. Based on this measurement, characteristics are first obtained and model card parameters extracted without any
loop back, i.e. each parameter is extracted only once on a given characteristic. After this extraction procedure, model card values
are validated through a comparison with an extra characteristics SET-Low characteristic not used for the extraction.
Cited literature [13 references]
https://hal-cea.archives-ouvertes.fr/cea-02188521
Contributor : Bruno Savelli Connect in order to contact the contributor
Submitted on : Tuesday, October 22, 2019 - 2:49:40 PM
Last modification on : Tuesday, March 30, 2021 - 3:23:45 AM
Long-term archiving on: : Thursday, January 23, 2020 - 7:21:01 PM
Contributor : Bruno Savelli Connect in order to contact the contributor
Submitted on : Tuesday, October 22, 2019 - 2:49:40 PM
Last modification on : Tuesday, March 30, 2021 - 3:23:45 AM
Long-term archiving on: : Thursday, January 23, 2020 - 7:21:01 PM
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