Benedikt Haas, Jean-Luc Rouviere, Victor Boureau, Remy Berthier, David Cooper. Direct comparison of off-axis holography and differential phase contrast for the mapping of electric fields in semiconductors by transmission electron microscopy.
Ultramicroscopy, Elsevier, 2019, 198, pp.58-72.
⟨10.1016/j.ultramic.2018.12.003⟩.
⟨cea-02186458⟩