Alessandro Grossi, Elisa Vianello, Mohamed M. Sabry, Marios Barlas, Laurent Grenouillet, et al.. Resistive RAM Endurance Array-Level Characterization and Correction Techniques Targeting Deep Learning Applications.
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2019, 66 (3), pp.1281-1288.
⟨10.1109/TED.2019.2894387⟩.
⟨cea-02186452⟩