B. Allouche, I. Gueye, G. Le Rhun, P. Gergaud, N. Vaxelaire. In-situ X-ray diffraction on functional thin films using a laboratory source during electrical biasing.
Materials and Design, Elsevier, 2018, 154, pp.340-346.
⟨10.1016/j.matdes.2018.05.016⟩.
⟨cea-02186192⟩