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Analysis of the Resistance Drift of Polycrystalline Phase-Change Materials by Low Frequency Noise Measurementtration

Sarra Souiki Souiki-Figuigui 1, 2 Véronique Sousa 1 Gérard Ghibaudo 2 Gabriele Navarro 1 Martin Coué 1 Luca Perniola 3 Paola Zuliani 4 R. Annunziata 4 
1 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
2 IMEP-LAHC - Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation
3 CEA - Commissariat à l'énergie atomique et aux énergies alternatives
4 ST-AGRATE - STMicroelectronics [Agrate Brianza]
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Conference papers
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https://hal-cea.archives-ouvertes.fr/cea-02051740
Contributor : Frédérique Ducroquet Connect in order to contact the contributor
Submitted on : Thursday, February 28, 2019 - 8:21:42 AM
Last modification on : Tuesday, October 19, 2021 - 10:59:18 AM

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  • HAL Id : cea-02051740, version 1

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CEA | UNIV-SAVOIE | UGA | CNRS | IMEP-LAHC | DRT | LETI | CEA-GRE

Citation

Sarra Souiki Souiki-Figuigui, Véronique Sousa, Gérard Ghibaudo, Gabriele Navarro, Martin Coué, et al.. Analysis of the Resistance Drift of Polycrystalline Phase-Change Materials by Low Frequency Noise Measurementtration. 2015 MRS Spring Meeting & Exhibit: Symposium Y: Phase-Change Materials for Data Storage, Cognitive Processing and Photonics Applications, R. Agarwal, H.Y. Cheng, R. Mazzarello, R. Simpson, Apr 2015, San Francisco, United States. ⟨cea-02051740⟩

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