Skip to Main content Skip to Navigation
Conference papers

Analysis of the Resistance Drift of Polycrystalline Phase-Change Materials by Low Frequency Noise Measurementtration

Complete list of metadatas

https://hal-cea.archives-ouvertes.fr/cea-02051740
Contributor : Frédérique Ducroquet <>
Submitted on : Thursday, February 28, 2019 - 8:21:42 AM
Last modification on : Saturday, November 21, 2020 - 3:32:59 AM

Identifiers

  • HAL Id : cea-02051740, version 1

Collections

Citation

Sarra Souiki-Figuigui, Véronique Sousa, Gérard Ghibaudo, Gabriele Navarro, Martin Coué, et al.. Analysis of the Resistance Drift of Polycrystalline Phase-Change Materials by Low Frequency Noise Measurementtration. 2015 MRS Spring Meeting & Exhibit: Symposium Y: Phase-Change Materials for Data Storage, Cognitive Processing and Photonics Applications, R. Agarwal, H.Y. Cheng, R. Mazzarello, R. Simpson, Apr 2015, San Francisco, United States. ⟨cea-02051740⟩

Share

Metrics

Record views

40