Analysis of the Resistance Drift of Polycrystalline Phase-Change Materials by Low Frequency Noise Measurementtration

Sarra Souiki Souiki-Figuigui (1, 2) , Véronique Sousa (1) , Gérard Ghibaudo (2) , Gabriele Navarro (1) , Martin Coué (1) , Luca Perniola (3) , Paola Zuliani (4) , R. Annunziata (4)

1 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
2 IMEP-LAHC - Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation
3 CEA - Commissariat à l'énergie atomique et aux énergies alternatives
4 ST-AGRATE - STMicroelectronics [Agrate Brianza]

Domains: Physics [physics]; Condensed Matter [cond-mat]; Materials Science [cond-mat.mtrl-sci]; Engineering Sciences [physics]; Electric power; Engineering Sciences [physics]; Micro and nanotechnologies/Microelectronics; Engineering Sciences [physics]; Materials

Sarra Souiki Souiki-Figuigui, Véronique Sousa, Gérard Ghibaudo, Gabriele Navarro, Martin Coué, et al.. Analysis of the Resistance Drift of Polycrystalline Phase-Change Materials by Low Frequency Noise Measurementtration. 2015 MRS Spring Meeting & Exhibit: Symposium Y: Phase-Change Materials for Data Storage, Cognitive Processing and Photonics Applications, R. Agarwal, H.Y. Cheng, R. Mazzarello, R. Simpson, Apr 2015, San Francisco, United States. ⟨cea-02051740⟩