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Tensile strained germanium nanowires measured by photocurrent spectroscopy and X-ray microdiffraction

Kevin Guilloy 1 Nicolas Pauc 1 Alban Gassenq 1 P. Gentile 1 Samuel Tardif 2 Francois Rieutord 2 Vincent Calvo 1
1 SiNaps - Silicon Nanoelectronics Photonics and Structures
PHELIQS - PHotonique, ELectronique et Ingénierie QuantiqueS : DRF/IRIG/PHELIQS
2 NRS [?-2019] - Nanostructures et Rayonnement Synchrotron [?-2019]
MEM - Modélisation et Exploration des Matériaux : DRF/IRIG/MEM
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https://hal-cea.archives-ouvertes.fr/cea-01998295
Contributor : Pascal Gentile <>
Submitted on : Tuesday, January 29, 2019 - 3:22:53 PM
Last modification on : Tuesday, September 1, 2020 - 3:24:04 PM

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  • HAL Id : cea-01998295, version 1

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Kevin Guilloy, Nicolas Pauc, Alban Gassenq, P. Gentile, Samuel Tardif, et al.. Tensile strained germanium nanowires measured by photocurrent spectroscopy and X-ray microdiffraction. E-MRS spring meeting, May 2015, Lille, France. ⟨cea-01998295⟩

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