Tensile strained germanium nanowires measured by photocurrent spectroscopy and X-ray microdiffraction

Kevin Guilloy (1) , Nicolas Pauc (1) , Alban Gassenq (1) , P. Gentile (1) , Samuel Tardif (2) , Francois Rieutord (2) , Vincent Calvo (1)

1 SiNaps - Silicon Nanoelectronics Photonics and Structures
2 NRS - Nanostructures et Rayonnement Synchrotron

Domains: Physics [physics]; Condensed Matter [cond-mat]; Materials Science [cond-mat.mtrl-sci]; Engineering Sciences [physics]; Micro and nanotechnologies/Microelectronics; Engineering Sciences [physics]; Materials; Engineering Sciences [physics]; Optics / Photonic

Kevin Guilloy, Nicolas Pauc, Alban Gassenq, P. Gentile, Samuel Tardif, et al.. Tensile strained germanium nanowires measured by photocurrent spectroscopy and X-ray microdiffraction. E-MRS spring meeting, May 2015, Lille, France. ⟨cea-01998295⟩