Tensile strained germanium nanowires measured by photocurrent spectroscopy and X-ray microdiffraction

Kevin Guilloy 1 Nicolas Pauc 1 Alban Gassenq 1 P. Gentile 1 Samuel Tardif 2 Francois Rieutord 2 Vincent Calvo 1
1 SiNaps - Silicon Nanoelectronics Photonics and Structures
PHELIQS - PHotonique, ELectronique et Ingénierie QuantiqueS : DRF/INAC/PHELIQS
2 NRS - Nanostructures et Rayonnement Synchrotron
MEM - Modélisation et Exploration des Matériaux : DRF/INAC/MEM
Document type :
Conference papers
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https://hal-cea.archives-ouvertes.fr/cea-01998295
Contributor : Pascal Gentile <>
Submitted on : Tuesday, January 29, 2019 - 3:22:53 PM
Last modification on : Wednesday, June 26, 2019 - 3:26:04 PM

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Kevin Guilloy, Nicolas Pauc, Alban Gassenq, P. Gentile, Samuel Tardif, et al.. Tensile strained germanium nanowires measured by photocurrent spectroscopy and X-ray microdiffraction. E-MRS spring meeting, May 2015, Lille, France. ⟨cea-01998295⟩

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