OPTICAL SPECTROSCOPY AND X-RAY MICRODIFFRACTION STUDY OF HIGHLY STRAINED GE NANOSTRUCTURES

  Kevin Guilloy ¹ AuthorId : 1621361
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  Nicolas Pauc ¹ AuthorId : 1010406
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  Alban Gassenq ¹ AuthorId : 1621360
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  P. Gentile ¹ AuthorId : 314892

Author IdHAL : pascal-gentile ORCID : https://orcid.org/0000-0002-1547-4247

  Samuel Tardif ² AuthorId : 11334274

Author IdHAL : samuel-tardif

  Francois Rieutord ² AuthorId : 11252186

Author IdHAL : francois-rieutord ORCID : https://orcid.org/0000-0003-4697-3652

  Vincent Calvo ¹ AuthorId : 156442
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  J.M. Escalante ³ AuthorId : 613188
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  Ivan Duchemin ⁴ AuthorId : 760356
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  Y. M. Niquet ⁵ AuthorId : 1076873
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  Guilherme Osvaldo Dias ⁴ AuthorId : 11254732
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  D. Rouchon ⁴ AuthorId : 458265
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  J. Widiez ⁴ AuthorId : 621422
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  J.M. Hartmann ⁴ AuthorId : 11382456

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  Alexei Chelnokov ⁴ AuthorId : 1023725
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  Vincent Reboud ⁴ AuthorId : 893541
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  Richard Geiger ⁶ AuthorId : 11252190
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  Thomas Zabel ⁶ AuthorId : 1621358
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  Hans Sigg ⁶ AuthorId : 1596603
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  Jerome Faist ⁷ AuthorId : 133592
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