OPTICAL SPECTROSCOPY AND X-RAY MICRODIFFRACTION STUDY OF HIGHLY STRAINED GE NANOSTRUCTURES

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https://hal-cea.archives-ouvertes.fr/cea-01998277
Contributor : Pascal Gentile <>
Submitted on : Tuesday, January 29, 2019 - 3:17:19 PM
Last modification on : Wednesday, June 26, 2019 - 3:26:04 PM

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Kevin Guilloy, Nicolas Pauc, Alban Gassenq, P. Gentile, Samuel Tardif, et al.. OPTICAL SPECTROSCOPY AND X-RAY MICRODIFFRACTION STUDY OF HIGHLY STRAINED GE NANOSTRUCTURES. 12th International Conference on Group IV Photonics, Aug 2015, Vancouver, Canada. ⟨cea-01998277⟩

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