OPTICAL SPECTROSCOPY AND X-RAY MICRODIFFRACTION STUDY OF HIGHLY STRAINED GE NANOSTRUCTURES - Archive ouverte HAL Access content directly
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OPTICAL SPECTROSCOPY AND X-RAY MICRODIFFRACTION STUDY OF HIGHLY STRAINED GE NANOSTRUCTURES

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Samuel Tardif
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Dates and versions

cea-01998277 , version 1 (29-01-2019)

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  • HAL Id : cea-01998277 , version 1

Cite

Kevin Guilloy, Nicolas Pauc, Alban Gassenq, P. Gentile, Samuel Tardif, et al.. OPTICAL SPECTROSCOPY AND X-RAY MICRODIFFRACTION STUDY OF HIGHLY STRAINED GE NANOSTRUCTURES. 12th International Conference on Group IV Photonics, Aug 2015, Vancouver, Canada. ⟨cea-01998277⟩
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