The evolution of the fraction of Er ions sensitized by Si nanostructures in silicon-rich silicon oxide thin films

  P. Noe ^{1, 2, 3} AuthorId : 196047
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  H. Okuno ⁴ AuthorId : 36328
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  J.-B. Jager ^{3, 5, 6} AuthorId : 11381516

Author Employer institution : Commissariat à l'énergie atomique et aux énergies alternatives IdHAL : jean-baptiste-jager

  E Delamadeleine ³ AuthorId : 11381517
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  O. Demichel ⁷ AuthorId : 412697
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  J-L Rouvière AuthorId : 11381518
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  V. Calvo ³ AuthorId : 302379
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  C. Maurizio ⁸ AuthorId : 698499
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  F. D’acapito ⁸ AuthorId : 11275035
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