Bruna Cardoso Paz, Mikaël Cassé, Sylvain Barraud, Gilles Reimbold, Maud Vinet, et al.. New method for individual electrical characterization of stacked SOI nanowire MOSFETs.
2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2017, Burlingame, United States.
⟨10.1109/S3S.2017.8309237⟩.
⟨cea-01974212⟩