S. Barraud, V. Lapras, B. Previtali, M. Samson, J. Lacord, et al.. Performance and Design Considerations for Gate-All-Around Stacked-NanoWires FETs.
2017 IEEE International Electron Devices Meeting (IEDM), Dec 2017, San Francisco, United States.
⟨10.1109/IEDM.2017.8268473⟩.
⟨cea-01973409⟩