Ibrahima Gueye, Gwenael Le Rhun, Olivier Renault, David Cooper, Emmanuel Defay, et al.. Correlation of electrical characteristics with interface chemistry and structure in Pt/Ru/PbZr$_{0.52}$ Ti$_{0.48}$O$_3$/Pt capacitors after post metallization annealing.
Applied Physics Letters, American Institute of Physics, 2018, 113, pp.132901.
⟨10.1063/1.5041767⟩.
⟨cea-01935332⟩