Self-trapping relaxation decay investigated by time-resolved photoelectron spectroscopy

Abstract : The present work combines time-resolved photoelectron spectroscopy on isolated species with high-level data processing to address an issue which usually pertains to materials science: the electronic relaxation dynamics towards the formation of a self-trapped exciton (STE). Such excitons are common excited states in ionic crystals, silica and rare gas matrices. They are associated with a strong local deformation of the matrix. Argon clusters were taken as a model. They are excited initially to a Wannier exciton at 14 eV and their evolution towards the formation of an STE has showed an unusual type of vibronic relaxation where the electronic excitation of the cluster decreases linearly as a function of time with a 0.59 ± 0.06 eV ps−1 rate. The decay was followed for 3.0 ps, and the STE formation occurred in ∼5.1 ± 0.7 ps.
Type de document :
Article dans une revue
Physical Chemistry Chemical Physics, Royal Society of Chemistry, 2018, 20 (16), pp.11206 - 11214. 〈10.1039/C7CP06789E〉
Liste complète des métadonnées

https://hal-cea.archives-ouvertes.fr/cea-01881652
Contributeur : Caroline Lebe <>
Soumis le : mercredi 26 septembre 2018 - 10:51:50
Dernière modification le : jeudi 4 octobre 2018 - 01:21:39

Identifiants

Citation

Aude Lietard, Giovanni Piani, Marc Briant, Marc-André Gaveau, Sylvain Faisan, et al.. Self-trapping relaxation decay investigated by time-resolved photoelectron spectroscopy. Physical Chemistry Chemical Physics, Royal Society of Chemistry, 2018, 20 (16), pp.11206 - 11214. 〈10.1039/C7CP06789E〉. 〈cea-01881652〉

Partager

Métriques

Consultations de la notice

26