Radiation-Induced Chemical Dynamics in Ar Clusters Exposed to Strong X-Ray Pulses - Archive ouverte HAL Access content directly
Journal Articles Physical Review Letters Year : 2018

Radiation-Induced Chemical Dynamics in Ar Clusters Exposed to Strong X-Ray Pulses

, , , , , , , (1) , , , , , , , , (2) , (2, 3) , , , (4) , (4) , (4) , , , , (5)
1
2
3
4
5
Yoshiaki Kumagai
  • Function : Author
Zoltan Jurek
  • Function : Author
Weiqing Xu
  • Function : Author
Hironobu Fukuzawa
Koji Motomura
  • Function : Author
Denys Iablonskyi
  • Function : Author
Kiyonobu Nagaya
  • Function : Author
Subhendu Mondal
  • Function : Author
Tetsuya Tachibana
  • Function : Author
Yuta Ito
  • Function : Author
Tsukasa Sakai
  • Function : Author
Kenji Matsunami
  • Function : Author
Toshiyuki Nishiyama
  • Function : Author
Takayuki Umemoto
  • Function : Author
Christophe Nicolas
  • Function : Author
  • PersonId : 759783
  • IdRef : 075098865
Tadashi Togashi
  • Function : Author
Kanade Ogawa
  • Function : Author
Sang-Kil Son
  • Function : Author
Beata Ziaja
  • Function : Author
Robin Santra
  • Function : Author
Kiyoshi Ueda

Abstract

We show that electron and ion spectroscopy reveals the details of the oligomer formation in Ar clusters exposed to an x-ray free electron laser (XFEL) pulse, i.e., chemical dynamics triggered by x rays. With guidance from a dedicated molecular dynamics simulation tool, we find that van der Waals bonding, the oligomer formation mechanism, and charge transfer among the cluster constituents significantly affect ionization dynamics induced by an XFEL pulse of moderate fluence. Our results clearly demonstrate that XFEL pulses can be used not only to “damage and destroy” molecular assemblies but also to modify and transform their molecular structure. The accuracy of the predictions obtained makes it possible to apply the cluster spectroscopy, in connection with the respective simulations, for estimation of the XFEL pulse fluence in the fluence regime below single-atom multiple-photon absorption, which is hardly accessible with other diagnostic tools.

Dates and versions

cea-01881635 , version 1 (26-09-2018)

Identifiers

Cite

Yoshiaki Kumagai, Zoltan Jurek, Weiqing Xu, Hironobu Fukuzawa, Koji Motomura, et al.. Radiation-Induced Chemical Dynamics in Ar Clusters Exposed to Strong X-Ray Pulses. Physical Review Letters, 2018, 120 (22), ⟨10.1103/PhysRevLett.120.223201⟩. ⟨cea-01881635⟩
23 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More