Johan Pelloux-Prayer, Mikael Casse, Francois Triozon, Sylvain Barraud, Yann-Michel Niquet, et al.. Strain effect on mobility in nanowire MOSFETs down to 10 nm width: Geometrical effects and piezoresistive model.
Solid-State Electronics, Elsevier, 2016, 125, pp.175-181.
⟨10.1016/j.sse.2016.09.002⟩.
⟨cea-01851576⟩