S. Sarrazin, S. Evain, L.A. de Barros Naviner, Y. Bonhomme, V. Gherman. Scan design with shadow flip-flops for low performance overhead and concurrent delay fault detection.
16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013, Mar 2013, Grenoble, France. pp.1077-1082,
⟨10.7873/DATE.2013.227⟩.
⟨cea-01844714⟩