Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data - Archive ouverte HAL Access content directly
Conference Papers Year : 2017

Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data

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Abstract

In this paper, we propose a new circuit architecture and a reading/programming strategy to emulate both Short and Long Term Plasticity (STP, LTP) rules using non-volatile OxRAM cells. For the first time, we show how the intrinsic OxRAM device switching probability at ultra-low power can be exploited to implement STP as well as LTP learning rules. Moreover, we demonstrate the computational power that STP can provide for reliable signal detection in highly noisy input data. A Fully Connected Neural Network incorporating STP and LTP learning rules is used to demonstrate two applications: (i) visual pattern extraction and (ii) decoding of neural signals. A high accuracy is obtained even in presence of significant background noise in the input data.
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Dates and versions

cea-01839875 , version 1 (16-07-2018)

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Cite

T. Werner, E. Vianello, O. Bichler, A. Grossi, E. Nowak, et al.. Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data. 2016 IEEE International Electron Devices Meeting (IEDM), Dec 2016, San Francisco, United States. pp.16.6.1-16.6.4, ⟨10.1109/IEDM.2016.7838433⟩. ⟨cea-01839875⟩
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