Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data

T. Werner; E. Vianello; O. Bichler; A. Grossi; E. Nowak; J.-F. Nodin; B. Yvert; B. Desalvo; L. Perniola

doi:10.1109/IEDM.2016.7838433

Conference papers

Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data

T. Werner ¹ E. Vianello ¹ O. Bichler ² A. Grossi ¹ E. Nowak ¹ J.-F. Nodin ¹ B. Yvert ^{3, 4} B. Desalvo ¹ L. Perniola ¹

1 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information

2 DACLE-LIST - Département d'Architectures, Conception et Logiciels Embarqués-LIST

3 UGA [2016-2019] - Université Grenoble Alpes [2016-2019]

4 Clinatec - Centre de recherche biomédicale Edmond J.Safra

Abstract : In this paper, we propose a new circuit architecture and a reading/programming strategy to emulate both Short and Long Term Plasticity (STP, LTP) rules using non-volatile OxRAM cells. For the first time, we show how the intrinsic OxRAM device switching probability at ultra-low power can be exploited to implement STP as well as LTP learning rules. Moreover, we demonstrate the computational power that STP can provide for reliable signal detection in highly noisy input data. A Fully Connected Neural Network incorporating STP and LTP learning rules is used to demonstrate two applications: (i) visual pattern extraction and (ii) decoding of neural signals. A high accuracy is obtained even in presence of significant background noise in the input data.

Keywords : Circuit architectures Computational power Experimental demonstrations Fully connected neural network Reliable detection Switching probability Synaptic plasticity Signal detection Background noise Input output programs Electron devices

Document type :

Conference papers

Domain :

Engineering Sciences [physics]

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https://hal-cea.archives-ouvertes.fr/cea-01839875
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Submitted on : Monday, July 16, 2018 - 10:11:57 AM
Last modification on : Friday, November 6, 2020 - 4:27:20 AM

Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data

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Experimental demonstration of short and long term synaptic plasticity using OxRAM multi k-bit arrays for reliable detection in highly noisy input data

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