M. Altieri, S. Lesecq, D. Puschini, O. Heron, E. Beigne, et al.. Evaluation and mitigation of aging effects on a digital on-chip voltage and temperature sensor.
2015 25th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), Sep 2015, Salvador, Brazil. pp.111-117,
⟨10.1109/PATMOS.2015.7347595⟩.
⟨cea-01838141⟩