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Conference papers
Fine-grain analysis of the parameters involved in aging of digital circuits
Abstract : Integrated circuits' aging is recognized as a key reliability bottleneck. Its estimation at design time is mandatory to define the lifetime of the circuit and its monitoring during the circuit's operation is necessary to guarantee high performances and avoid timing failures. Various parameters are involved in the process of aging. The knowledge of their impact can help the designer in optimizing the estimation at design time or selecting which parameters are most critical to monitor. This paper presents a fine-grain analysis of the parameters involved in the degradation of digital circuits.
https://hal-cea.archives-ouvertes.fr/cea-01836856
Contributor : Léna Le Roy Connect in order to contact the contributor
Submitted on : Thursday, July 12, 2018 - 3:05:18 PM
Last modification on : Saturday, June 26, 2021 - 3:41:02 AM
Contributor : Léna Le Roy Connect in order to contact the contributor
Submitted on : Thursday, July 12, 2018 - 3:05:18 PM
Last modification on : Saturday, June 26, 2021 - 3:41:02 AM