Skip to Main content Skip to Navigation
Conference papers

Binary-Level Testing of Embedded Programs

Sébastien Bardin 1 Philippe Baufreton 2 Nicolas Cornuet 3 Philippe Herrmann 1 Sébastien Labbé 3
1 DILS - Département Ingénierie Logiciels et Systèmes
2 SAGEM Défense Sécurité [Massy]
3 EDF - EDF
Abstract : Dynamic Symbolic Execution (DSE) is a powerful approach to automatic test data generation. It has been heavily used in recent years for finding bugs in desktop programs. In this article, we discuss the use of binary-level DSE for testing safety-critical embedded systems. More especially, we present several innovative features implemented in our DSE tool OSMOSE, and we show through four case-studies how these features can be used in practical situations.
Document type :
Conference papers
Complete list of metadatas
https://hal-cea.archives-ouvertes.fr/cea-01836221
Contributor : Léna Le Roy <>
Submitted on : Thursday, July 12, 2018 - 10:40:39 AM
Last modification on : Monday, February 10, 2020 - 6:14:14 PM

Links full text

openaccess

Identifiers

Collections

CEA | DRT | LIST | EDF

Citation

Sébastien Bardin, Philippe Baufreton, Nicolas Cornuet, Philippe Herrmann, Sébastien Labbé. Binary-Level Testing of Embedded Programs. 2013 13th International Conference on Quality Software (QSIC), Jul 2013, Najing, China. ⟨10.1109/QSIC.2013.49⟩. ⟨cea-01836221⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

106