Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5 ≤ E ≤ 28 keV

Y. Ménesguen; M.-C. Lépy

doi:10.1002/xrs.1366

Journal Articles X-Ray Spectrometry Year : 2011

Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5 ≤ E ≤ 28 keV

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1

Y. Ménesguen

Function : Author

Laboratoire National Henri Becquerel

M.-C. Lépy

Function : Author

Laboratoire National Henri Becquerel

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Physics [physics]

Yves Ménesguen : Connect in order to contact the contributor

https://hal-cea.archives-ouvertes.fr/cea-01833255

Submitted on : Monday, July 9, 2018-2:57:23 PM

Last modification on : Saturday, June 25, 2022-9:11:37 PM

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cea-01833255 , version 1 (09-07-2018)

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HAL Id : cea-01833255 , version 1
DOI : 10.1002/xrs.1366

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Y. Ménesguen, M.-C. Lépy. Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5 ≤ E ≤ 28 keV. X-Ray Spectrometry, 2011, 40 (6), pp.411 - 416. ⟨10.1002/xrs.1366⟩. ⟨cea-01833255⟩

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