Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5 ≤ E ≤ 28 keV - Archive ouverte HAL Access content directly
Journal Articles X-Ray Spectrometry Year : 2011

Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5 ≤ E ≤ 28 keV

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cea-01833255 , version 1 (09-07-2018)

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Y. Ménesguen, M.-C. Lépy. Characterization of the Metrology beamline at the SOLEIL synchrotron and application to the determination of mass attenuation coefficients of Ag and Sn in the range 3.5 ≤ E ≤ 28 keV. X-Ray Spectrometry, 2011, 40 (6), pp.411 - 416. ⟨10.1002/xrs.1366⟩. ⟨cea-01833255⟩

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